RO3112A
• Designed for 433.92 MHz Superheterodyne Receiver LOs
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS)
The RO3112A is a one-port surface-acoustic-wave (SAW) resonator packaged in a surface-mount ceramic
case. It provides reliable, fundamental-mode quartz frequency stabilization of local oscillators operating at
433.42 MHz. The RO3112Ais designed for 433.92 MHz superheterodyne receivers with a 500 kHz IF (Philips
UAA3201T). Applications include remote-control and wireless security receivers operating in Europe under
ETSI EN 300 220-2.
433.42 MHz
SAW
Resonator
Absolute Maximum Ratings
Rating
Value
+0
Units
dBm
VDC
°C
CW RF Power Dissipation (See Typical Test Circuit)
DC Voltage Between Terminals (Observe ESD Precautions)
Case Temperature
±30
SM5035-4
-40 to +85
260
Soldering Temperature (10 seconds / 5 cycles maximum)
°C
Electrical Characteristics
Characteristic
Sym
Notes
2, 3, 4, 5
2, 5, 6
Minimum
Typical
Maximum
433.495
±75
Units
MHz
kHz
Center Frequency, +25 °C
Absolute Frequency
fC
fC
IL
433.345
Tolerance from 433.42 MHz
Insertion Loss
Quality Factor
1.4
8000
1300
25
1.6
dB
Unloaded Q
QU
QL
TO
fO
5, 6, 7
50 Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
10
40
°C
fC
6, 7, 8
ppm/°C2
ppm/yr
Frequency Temperature Coefficient
Absolute Value during the First Year
FTC
|fA|
0.032
10
Frequency Aging
1
5
DC Insulation Resistance between Any Two Terminals
1.0
M
RF Equivalent RLC Model
Motional Resistance
RM
LM
18.6
54.8
2.5
25
Motional Inductance
µH
5, 7, 9
Motional Capacitance
Transducer Static Capacitance
CM
fF
CO
5, 6, 9
2, 7
3.7
pF
Test Fixture Shunt Inductance
Lid Symbolization
LTEST
36.8
nH
658 // YYWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
NOTES:
1.
2.
Frequency aging is the change in f with time and is specified at +65 °C or
7.
8.
Derived mathematically from one or more of the following directly
measured parameters: f , IL, 3 dB bandwidth, f versus T , and C .
C
less. Aging may exceed the specification for prolonged temperatures
above +65 °C. Typically, aging is greatest the first year after manufacture,
decreasing in subsequent years.
C
C
C
O
Turnover temperature, T , is the temperature of maximum (or turnover)
O
frequency, f . The nominal frequency at any case temperature, T , may be
O
C
The center frequency, f , is measured at the minimum insertion loss point,
C
2
calculated from: f = f [1 - FTC (T -T ) ]. Typically, oscillator T is
O
O
C
O
IL , with the resonator in the 50 test system (VSWR 1.2:1). The
MIN
approximately equal to the specified resonator T .
O
shunt inductance, L
, is tuned for parallel resonance with C at f .
TEST
O
C
9.
This equivalent RLC model approximates resonator performance near the
resonant frequency and is provided for reference only. The capacitance C
is the static (nonmotional) capacitance between the two terminals
measured at low frequency (10 MHz) with a capacitance meter. The
Typically, f
or f
is approximately equal to the
OSCILLATOR
TRANSMITTER
O
resonator f .
C
3.
4.
One or more of the following United States patents apply: 4,454,488 and
4,616,197.
measurement includes parasitic capacitance with “NC” pads unconnected.
Case parasitic capacitance is approximately 0.05 pF. Transducer parallel
capacitance can be calculated as: C C - 0.05 pF.
Typically, equipment utilizing this device requires emissions testing and
government approval, which is the responsibility of the equipment
manufacturer.
P
O
10. Packaged in 500PC Tape carrier.
5.
6.
Unless noted otherwise, case temperature T = +25 ± 2 °C.
C
The design, manufacturing process, and specifications of this device are
subject to change without notice.
Copyright © Murata Manufacturing Co., Ltd. All rights reserved. April 2014
RO3112A (R) 11/21/17 Page 1 of 2
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