RO3134A
• Very Low Series Resistance
• Quartz Stability
• Surface-Mount, Ceramic Case with 21 mm2 Footprint
• Complies with Directive 2002/95/EC (RoHS)
372.5 MHz
SAW
Pb
The RO3134A is a true one-port, surface-acoustic-wave (SAW) resonator in a surface-mount, ceramic case.
It provides reliable, fundamental-mode, quartz frequency stabilization of local oscillators operating at
approximately 372.5 MHz.
Resonator
Absolute Maximum Ratings
Rating
Value
+10
Units
dBm
VDC
°C
CW RF Power Dissipation (See Typical Test Circuit)
DC Voltage Between Terminals (Observe ESD Precautions)
Case Temperature
±30
-40 to +85
260
Soldering Temperature (10 seconds / 5 cycles maximum)
°C
SM5035-4
Electrical Characteristics
Characteristic
Sym
Notes
Minimum
Typical
Maximum
Units
f
Frequency (+25 °C)
Nominal Frequency
372.400
372.600
MHz
kHz
dB
C
2, 3, 4, 5
∆f
Tolerance from 372.500 MHz
±100
2.2
C
Insertion Loss
Quality Factor
IL
2, 5, 6
5, 6, 7
1.0
15,400
1,700
25
Q
Unloaded Q
U
Q
T
50 Ω Loaded Q
L
Temperature Stability
Turnover Temperature
Turnover Frequency
10
40
°C
O
f
f
6, 7, 8
O
C
2
Frequency Temperature Coefficient
Absolute Value during the First Year
FTC
0.032
10
ppm/°C
|f |
Frequency Aging
1, 6
5
ppm/yr
MΩ
Ω
A
DC Insulation Resistance between Any Two Terminals
1.0
R
RF Equivalent RLC Model
Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
12.7
83
M
L
5, 6, 7, 9
µH
M
C
2.2
2.4
76
fF
M
C
5, 6, 9
2, 7
pF
O
L
Test Fixture Shunt Inductance
Lid Symbolization
nH
TEST
836//YYWWSR
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
1. Frequency aging is the change in f with time and is specified at
are subject to change without notice.
C
7. Derived mathematically from one or more of the following directly
measured parameters: f , IL, 3 dB bandwidth, f versus T , and C .
+65°C or less. Aging may exceed the specification for prolonged tem-
peratures above +65°C. Typically, aging is greatest the first year after
manufacture, decreasing in subsequent years.
C
C
C
O
8. Turnover temperature, T , is the temperature of maximum (or
O
2. The center frequency, f , is measured at the minimum insertion loss
C
turnover) frequency, f . The nominal frequency at any case
O
point, IL , with the resonator in the 50 Ω test system (VSWR ≤
MIN
2
temperature, T , may be calculated from: f = f [1 - FTC (T -T ) ].
C
O
O
C
1.2:1). The shunt inductance, L
, is tuned for parallel resonance
TEST
Typically oscillator T is approximately equal to the specified
O
with C at f . Typically, f
or f
is approximately
O
C
OSCILLATOR
TRANSMITTER
resonator T .
O
equal to the resonator f .
C
9. This equivalent RLC model approximates resonator performance near
the resonant frequency and is provided for reference only. The
3. One or more of the following United States patents apply: 4,454,488
and 4,616,197.
4. Typically, equipment utilizing this device requires emissions testing
and government approval, which is the responsibility of the equipment
manufacturer.
capacitance C is the static (nonmotional) capacitance between the
O
two terminals measured at low frequency (10 MHz) with a capacitance
meter. The measurement includes parasitic capacitance with "NC”
pads unconnected. Case parasitic capacitance is approximately
0.05 pF. Transducer parallel capacitance can by calculated as:
5. Unless noted otherwise, case temperature T = +25°C±2°C.
C
6. The design, manufacturing process, and specifications of this device
C
≈ C - 0.05 pF.
P
O
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©2008 by RF Monolithics, Inc.
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RO3134A - 12/4/08