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RO3138A
• Designed for 407.3 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS)
407.3 MHz
SAW
Pb
Resonator
The RO3138A is a one-port surface-acoustic-wave (SAW) resonator packaged in a surface-mount ceramic
case. It provides reliable, fundamental-mode quartz frequency stabilization of fixed-frequency transmitters
operating at 407.3 MHz.
Absolute Maximum Ratings
Rating
Value
+0
Units
dBm
VDC
°C
CW RF Power Dissipation (See: Typical Test Circuit)
DC voltage Between Terminals (Observe ESD Precautions)
Case Temperature
±30
-40 to +85
260
Soldering Temperature (10 seconds / 5 cycles maximum)
°C
SM5035-4
Electrical Characteristics
Characteristic
Sym
Notes
2,3,4,5
2,5,6
Minimum
Typical
Maximum
407.375
±75
Units
MHz
kHz
fC
fC
IL
Center Frequency, +25 °C
Absolute Frequency
407.225
Tolerance from 407.3 MHz
Insertion Loss
Quality Factor
1.3
14400
1900
25
1.9
dB
QU
QL
TO
fO
Unloaded Q
5,6,7
50 Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
10
40
°C
fC
6,7,8
ppm/°C2
ppm/yr
Frequency Temperature Coefficient
Absolute Value during the First Year
FTC
|fA|
0.032
10
Frequency Aging
1
5
DC Insulation Resistance between Any Two Terminals
1.0
M
RM
LM
RF Equivalent RLC Model
Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
15.6
87
5, 7, 9
µH
fF
CM
1.8
1.9
77
CO
5, 6, 9
2, 7
pF
nH
LTEST
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
837 // YYWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
NOTES:
1.
Frequency aging is the change in f with time and is specified at +65 °C or
subject to change without notice.
C
7.
8.
Derived mathematically from one or more of the following directly
measured parameters: f , IL, 3 dB bandwidth, f versus T , and C .
less. Aging may exceed the specification for prolonged temperatures
above +65 °C. Typically, aging is greatest the first year after manufacture,
decreasing in subsequent years.
C
C
C
O
Turnover temperature, T , is the temperature of maximum (or turnover)
O
2.
The center frequency, f , is measured at the minimum insertion loss point,
frequency, f . The nominal frequency at any case temperature, T , may be
C
O
C
IL , with the resonator in the 50 test system (VSWR 1.2:1). The
2
MIN
calculated from: f = f [1 - FTC (T -T ) ]. Typically oscillator T is
O
O
C
O
shunt inductance, L
, is tuned for parallel resonance with C at f .
TEST
O C
approximately equal to the specified resonator T .
This equivalent RLC model approximates resonator performance near the
resonant frequency and is provided for reference only. The capacitance C
is the static (nonmotional) capacitance between the two terminals
measured at low frequency (10 MHz) with a capacitance meter. The
measurement includes parasitic capacitance with "NC” pads unconnected.
Case parasitic capacitance is approximately 0.05 pF. Transducer parallel
capacitance can by calculated as: C C - 0.05 pF.
O
Typically, f
or f
is approximately equal to the
OSCILLATOR
TRANSMITTER
9.
resonator f .
C
O
3.
4.
One or more of the following United States patents apply: 4,454,488 and
4,616,197.
Typically, equipment utilizing this device requires emissions testing and
government approval, which is the responsibility of the equipment
manufacturer.
P
O
5.
6.
Unless noted otherwise, case temperature T = +25 ± 2 °C.
C
10. Tape and Reel standard per ANSI / EIA 481.
The design, manufacturing process, and specifications of this device are
©2010-2014 by Murata Electronics N.A., Inc.
RO3138A (R) 4/23/14
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