RO3125A-2
• Ideal for 304.3 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-Mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS)
304.3 MHz
SAW
Pb
The RO3125A-2 is a true one-port, surface-acoustic-wave (SAW) resonator in a surface-mount, ceramic case.
It provides reliable, fundamental-mode, quartz frequency stabilization of fixed-frequency transmitters
operating at 304.3 MHz.
Absolute Maximum Ratings
Rating
Value
+0
Units
dBm
VDC
°C
CW RF Power Dissipation (See: Typical Test Circuit)
DC voltage Between Terminals (Observe ESD Precautions)
Case Temperature
±30
-40 to +85
260
Soldering Temperature (10 seconds / 5 cycles max.)
°C
SM5035-4
Electrical Characteristics
Characteristic
Sym
Notes
2,3,4,5
2,5,6
Minimum
Typical
Maximum
304.350
±50
Units
Center Frequency (+25 °C)
Absolute Frequency
fC
Df
304.250
MHz
kHz
dB
Tolerance from 304.3 MHz
C
Insertion Loss
Quality Factor
IL
1.0
16290
1413
25
1.5
Q
Unloaded Q
U
5,6,7
Q
50 Ω Loaded Q
L
Temperature Stability
Turnover Temperature
Turnover Frequency
TO
10
40
°C
f
f
6,7,8
O
C
2
Frequency Temperature Coefficient
Absolute Value during the First Year
FTC
0.032
ppm/°C
|f |
Frequency Aging
1
5
≤10
ppm/yr
MΩ
W
A
DC Insulation Resistance between Any Two Terminals
1.0
R
RF Equivalent RLC Model
Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
9.5
80.9
3.3
M
L
5, 7, 9
µH
M
C
fF
M
C
5, 6, 9
2, 7
3.1
pF
O
L
Test Fixture Shunt Inductance
87.5
nH
TEST
Lid Symbolization (in addition to Lot and/or Date Codes)
815 // YWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
1.
2.
Frequency aging is the change in f with time and is specified at +65°C or
C
measured parameters: f , IL, 3 dB bandwidth, f versus T , and C .
C C C O
less. Aging may exceed the specification for prolonged temperatures
above +65°C. Typically, aging is greatest the first year after manufacture,
decreasing in subsequent years.
8.
Turnover temperature, T , is the temperature of maximum (or turnover)
O
frequency, f . The nominal frequency at any case temperature, T , may be
O
C
2
calculated from: f = f [1 - FTC (T -T ) ]. Typically oscillator T is
O
O
C
O
The center frequency, f , is measured at the minimum insertion loss point,
C
approximately equal to the specified resonator T .
O
IL , with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The
MIN
9.
This equivalent RLC model approximates resonator performance near the
resonant frequency and is provided for reference only. The capacitance C
is the static (nonmotional) capacitance between the two terminals
measured at low frequency (10 MHz) with a capacitance meter. The
shunt inductance, L
, is tuned for parallel resonance with C at f .
TEST
O C
O
Typically, f
or f
is approximately equal to the
TRANSMITTER
OSCILLATOR
resonator f .
C
3.
4.
One or more of the following United States patents apply: 4,454,488 and
4,616,197.
measurement includes parasitic capacitance with "NC” pads unconnected.
Case parasitic capacitance is approximately 0.05 pF. Transducer parallel
capacitance can by calculated as: C ≈ C - 0.05 pF.
Typically, equipment utilizing this device requires emissions testing and
government approval, which is the responsibility of the equipment
manufacturer.
P
O
10. Tape and Reel standard per ANSI / EIA 481.
5.
6.
Unless noted otherwise, case temperature T = +25°C±2°C.
C
The design, manufacturing process, and specifications of this device are
subject to change without notice.
Derived mathematically from one or more of the following directly
7.
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©2008 by RF Monolithics, Inc.
RO3125A-2 - 4/10/08