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RN1967FE(TPL3) PDF预览

RN1967FE(TPL3)

更新时间: 2024-09-24 09:29:07
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
6页 347K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),SOT-363VAR

RN1967FE(TPL3) 技术参数

是否Rohs认证: 不符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.88最大集电极电流 (IC):0.1 A
最小直流电流增益 (hFE):80元件数量:2
极性/信道类型:NPN最大功率耗散 (Abs):0.1 W
子类别:BIP General Purpose Small Signal表面贴装:YES
晶体管元件材料:SILICONBase Number Matches:1

RN1967FE(TPL3) 数据手册

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RN1967FE~RN1969FE  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1967FE,RN1968FE,RN1969FE  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Two devices are incorporated into an Extreme-Super-Mini (6 pin)  
package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more compact  
equipment and save assembly cost.  
Complementary to RN2967FE to RN2969FE  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
RN1967FE  
RN1968FE  
RN1969FE  
10  
22  
47  
47  
47  
22  
R1  
B
JEDEC  
E
JEITA  
TOSHIBA  
Weight: 3mg (typ.)  
2-2N1A  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 common)  
Equivalent Circuit  
(top view)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
V
V
CBO  
CEO  
6
5
2
4
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
50  
RN1967FE  
RN1968FE  
RN1969FE  
6
7
V
C
V
Q2  
EBO  
Q1  
15  
I
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
P
(Note 1)  
100  
1
3
T
j
150  
Storage temperature range  
T
55 to150  
°C  
stg  
Note:  
Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the  
absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the  
Toshiba Semiconductor Reliability Handbook (“Handling  
Precautions”/“Derating Concept and Methods”) and individual  
reliability data (i.e. reliability test report and estimated failure rate,  
etc).  
Note 1: Total rating  
1
2010-05-20  

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