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RN1961FE(TE85L)

更新时间: 2024-11-15 19:59:03
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
8页 544K
描述
RN1961FE(TE85L)

RN1961FE(TE85L) 技术参数

生命周期:Obsolete包装说明:,
Reach Compliance Code:unknown风险等级:5.84
Base Number Matches:1

RN1961FE(TE85L) 数据手册

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RN1961FE~RN1966FE  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1961FE,RN1962FE,RN1963FE  
RN1964FE,RN1965FE,RN1966FE  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Two devices are incorporated into an Extreme-Super-Mini (6 pin)  
package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
Complementary to RN2961FE to RN2966FE  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
RN1961FE  
RN1962FE  
RN1963FE  
RN1964FE  
RN1965FE  
RN1966FE  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
R1  
B
22  
47  
JEDEC  
E
2.2  
4.7  
JEITA  
TOSHIBA  
Weight: 3mg (typ.)  
2-2N1A  
Equivalent Circuit  
(top view)  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 common)  
6
5
4
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
50  
50  
V
V
Q2  
CBO  
RN1961FE  
to 1966FE  
Q1  
Collector-emitter voltage  
V
CEO  
RN1961FE  
to 1964FE  
10  
5
Emitter-base voltage  
V
V
1
2
3
EBO  
RN1965FE,  
1966FE  
Collector current  
I
100  
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
(Note 1)  
C
RN1961FE  
to 1966FE  
T
150  
j
T
stg  
55 to150  
°C  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
1
2010-05-20  

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