Datasheet > RN1963FE(TE85L,F)

RN1963FE(TE85L,F)

更新时间： 2024-02-23 09:54:21

品牌	Logo	应用领域
东芝 - TOSHIBA		晶体管
页数	文件大小	规格书
8页	566K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),TSOP

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技术参数
数据手册

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RN1963FE(TE85L,F) 技术参数

是否Rohs认证：	符合	生命周期：	Obsolete
包装说明：	,	Reach Compliance Code：	unknown
风险等级：	5.83	Is Samacsys：	N
最大集电极电流 (IC)：	0.1 A	最小直流电流增益 (hFE)：	70
元件数量：	2	极性/信道类型：	NPN
最大功率耗散 (Abs)：	0.1 W	子类别：	BIP General Purpose Small Signal
表面贴装：	YES	晶体管元件材料：	SILICON
Base Number Matches：	1

RN1963FE(TE85L,F) 数据手册

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RN1961FE~RN1966FE

TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)

RN1961FE, RN1962FE, RN1963FE

RN1964FE, RN1965FE, RN1966FE

Switching, Inverter Circuit, Interface Circuit and

Unit: mm

Driver Circuit Applications

•

Two devices are incorporated into an Extreme-Super-Mini (6 pin)

package.

Incorporating a bias resistor into a transistor reduces parts count.

Reducing the parts count enable the manufacture of ever more

compact equipment and save assembly cost.

•

Complementary to RN2961FE to RN2966FE

Equivalent Circuit and Bias Resistor Values

Type No.

R1 (kΩ)

R2 (kΩ)

RN1961FE

RN1962FE

RN1963FE

RN1964FE

RN1965FE

RN1966FE

4.7

JEDEC

―

2.2

4.7

JEITA

TOSHIBA

Weight: 3mg (typ.)

2-2N1A

Equivalent Circuit

(top view)

Absolute Maximum Ratings (Ta = 25°C)

(Q1, Q2 common)

Characteristics

Collector-base voltage

Symbol

Rating

Unit

CBO

RN1961FE

to 1966FE

Collector-emitter voltage

CEO

RN1961FE

to 1964FE

Emitter-base voltage

EBO

RN1965FE

RN1966FE

Collector current

100

°C

Collector power dissipation

Junction temperature

Storage temperature range

(Note 1)

RN1961FE

to 1966FE

150

stg

−55 to150

°C

Note:

Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly

even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute

maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

Note 1: Total rating

Start of commercial production

2000-05

2014-03-01

12 3 4 5 6 7 8

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