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RN1901FE(TE85L,F) PDF预览

RN1901FE(TE85L,F)

更新时间: 2024-09-17 05:26:59
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
8页 543K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),TSOP

RN1901FE(TE85L,F) 数据手册

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RN1901FE~RN1906FE  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor Built-in Transistor)  
RN1901FE, RN1902FE, RN1903FE  
RN1904FE, RN1905FE, RN1906FE  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Two devices are incorporated into an Extreme-Super-Mini (6-pin)  
package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enables the manufacture of ever more compact  
equipment and lowers assembly cost.  
Complementary to RN2901FE to RN2906FE  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
RN1901FE  
RN1902FE  
RN1903FE  
RN1904FE  
RN1905FE  
RN1906FE  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
R1  
B
22  
JEDEC  
47  
E
JEITA  
2.2  
4.7  
TOSHIBA  
2-2N1G  
Weight: 3 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 common)  
Equivalent Circuit  
(top view)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
6
5
4
V
V
50  
50  
V
V
CBO  
CEO  
RN1901FE to  
RN1906FE  
Collector-emitter voltage  
Q2  
3
RN1901FE to  
RN1904FE  
Q1  
10  
Emitter-base voltage  
V
V
EBO  
RN1905FE,  
RN1906FE  
5
1
2
Collector current  
I
100  
100  
mA  
C
P
(Note  
C
Collector power dissipation  
mW  
RN1901FE to  
RN1906FE  
1)  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
stg  
55 to 150  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
1
2010-05-14  

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