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RN1902(TE85L,F) PDF预览

RN1902(TE85L,F)

更新时间: 2024-11-06 20:50:07
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
7页 460K
描述
Trans Digital BJT NPN 50V 100mA 6-Pin US T/R

RN1902(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Active
Reach Compliance Code:unknown风险等级:5.71
Base Number Matches:1

RN1902(TE85L,F) 数据手册

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RN1901~RN1906  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN1901,RN1902,RN1903  
RN1904,RN1905,RN1906  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
z Including two devices in US6 (ultra super mini type with 6 leads)  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2901 to RN2906  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN1901  
RN1902  
RN1903  
RN1904  
RN1905  
RN1906  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
US6  
22  
JEDEC  
47  
JEITA  
2.2  
4.7  
TOSHIBA  
Weight: 6.8mg(typ.)  
2-2J1A  
Equivalent Circuit (Top View)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1901 to 1906  
Collector-emitter voltage  
RN1901 to 1904  
RN1905, 1906  
10  
Emitter-base voltage  
V
V
EBO  
5
Collector current  
I
100  
200  
150  
55~150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
C
RN1901 to 1906  
T
j
T
stg  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*: Total rating  
1
2010-05-14  

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