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RN1710(TE85L,F) PDF预览

RN1710(TE85L,F)

更新时间: 2024-11-05 20:37:07
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
6页 284K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),SOT-353

RN1710(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.8最大集电极电流 (IC):0.1 A
最小直流电流增益 (hFE):120元件数量:2
极性/信道类型:NPN最大功率耗散 (Abs):0.2 W
子类别:BIP General Purpose Small Signal表面贴装:YES
晶体管元件材料:SILICONBase Number Matches:1

RN1710(TE85L,F) 数据手册

 浏览型号RN1710(TE85L,F)的Datasheet PDF文件第2页浏览型号RN1710(TE85L,F)的Datasheet PDF文件第3页浏览型号RN1710(TE85L,F)的Datasheet PDF文件第4页浏览型号RN1710(TE85L,F)的Datasheet PDF文件第5页浏览型号RN1710(TE85L,F)的Datasheet PDF文件第6页 
RN1710,RN1711  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN1710,RN1711  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
Unit: mm  
z Including two devices in USV (ultra super mini type with 5 leads)  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2710 and RN2711  
Equivalent Circuit  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
USV  
Characterisstic  
Collector-base voltage  
Symbol  
Rating  
Unit  
JEDEC  
V
CBO  
V
CEO  
V
EBO  
50  
50  
V
V
JEITA  
Collector-emitter voltage  
Emitter-base voltage  
TOSHIBA  
22L1A  
5
V
Weight: 6.2 mg (typ.)  
Collector current  
I
100  
mA  
mW  
°C  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
C
200  
T
j
150  
Equivalent Circuit  
(Top View)  
T
stg  
55 to150  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in temperature,  
etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.)  
are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba  
Semiconductor Reliability Handbook (“Handling Precautions”/“Derating  
Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*: Total rating  
1
2010-05-21  

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