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RN1607TE85L PDF预览

RN1607TE85L

更新时间: 2024-11-12 20:01:55
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
6页 273K
描述
TRANSISTOR 100 mA, 50 V, 2 CHANNEL, NPN, Si, SMALL SIGNAL TRANSISTOR, BIP General Purpose Small Signal

RN1607TE85L 技术参数

生命周期:ObsoleteReach Compliance Code:unknown
风险等级:5.79其他特性:BUILT-IN BIAS RESISTOR RATIO IS 0.213
最大集电极电流 (IC):0.1 A基于收集器的最大容量:6 pF
集电极-发射极最大电压:50 V配置:SEPARATE, 2 ELEMENTS WITH BUILT-IN RESISTOR
最小直流电流增益 (hFE):80JESD-30 代码:R-PDSO-G6
元件数量:2端子数量:6
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:DUAL晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):250 MHz
VCEsat-Max:0.3 VBase Number Matches:1

RN1607TE85L 数据手册

 浏览型号RN1607TE85L的Datasheet PDF文件第2页浏览型号RN1607TE85L的Datasheet PDF文件第3页浏览型号RN1607TE85L的Datasheet PDF文件第4页浏览型号RN1607TE85L的Datasheet PDF文件第5页浏览型号RN1607TE85L的Datasheet PDF文件第6页 
RN1607~RN1609  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1607, RN1608, RN1609  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
Unit: mm  
z Including two devices in SM6 (super-mini-type with six (6) leads)  
z With built-in bias resistors.  
z Simplified circuit design  
z Reduced number of parts and manufacturing process  
z Complementary to RN2607~RN2609  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN1607  
RN1608  
RN1609  
10  
22  
47  
47  
47  
22  
JEDEC  
JEITA  
TOSHIBA  
2-3N1A  
Weight: 0.015 g (typ.)  
Equivalent Circuit  
(Top View)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1607~1609  
Collector-emitter voltage  
RN1607  
RN1608  
RN1609  
6
Emitter-base voltage  
V
V
7
EBO  
15  
Collector current  
I
100  
300  
150  
55~150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN1607~1609  
T
j
T
stg  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
* Total rating  
1
2007-11-01  

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