Datasheet > RN1327A

RN1327A

更新时间： 2024-11-12 04:07:47

品牌	Logo	应用领域
东芝 - TOSHIBA		开关驱动
页数	文件大小	规格书
11页	211K
描述
Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications

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RN1327A 数据手册

RN1321A∼RN1327A

TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)

RN1321A,RN1322A,RN1323A,RN1324A

RN1325A,RN1326A,RN1327A

Switching, Inverter Circuit, Interface Circuit

And Driver Circuit Applications

Unit: mm

z High current driving is possible.

z Since bias resisters are built in the transistor,the miniaturization of the

apparatus by curtailment of the number of parts and laborsaving of an

assembly are possible.

z Many kinds of resistance value are lined up in order to support various

kinds of circuit design.

z Complementary to RN2321A~RN2327A

z Low V

enable to be low power dissipation on high current driving.

CE(sat)

Equivalent Circuit And Bias Resistance Values

1. BASE

2. EMITTER

3. COLLECTOR

Type No.

R1 (kΩ)

R2 (kΩ)

RN1321A

RN1322A

RN1323A

RN1324A

RN1325A

RN1326A

RN1327A

2.2

4.7

JEDEC

JEITA

⎯

2.2

4.7

SC-70

2-2E1A

TOSHIBA

0.47

Weight: 0.006 g (typ.)

2.2

Absolute Maximum Ratings (Ta = 25°C)

Characteristic

Symbol

Rating

Unit

Collector-base voltage

CBO

CEO

RN1321A~1327A

Collector-emitter voltage

Emitter-base voltage

RN1321A~1324A

RN1325A, 1326A

RN1327A

EBO

Collector current

500

100

150

−55~150

°C

Collector power dissipation

Junction temperature

Storage temperature range

RN1321A~1327A

stg

°C

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even

if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum

ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

2007-11-01

12 3 4 5 6 7...11

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