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RN1401(TE85R) PDF预览

RN1401(TE85R)

更新时间: 2024-11-12 20:10:31
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
8页 576K
描述
TRANSISTOR 100 mA, 50 V, NPN, Si, SMALL SIGNAL TRANSISTOR, 2-3F1A, 3 PIN, BIP General Purpose Small Signal

RN1401(TE85R) 技术参数

生命周期:Obsolete包装说明:SMALL OUTLINE, R-PDSO-G3
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.21.00.75
风险等级:5.76其他特性:BUILT-IN BIAS RESISTOR RATIO IS 1
最大集电极电流 (IC):0.1 A集电极-发射极最大电压:50 V
配置:SINGLE WITH BUILT-IN RESISTOR最小直流电流增益 (hFE):30
JESD-30 代码:R-PDSO-G3元件数量:1
端子数量:3封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:DUAL晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):250 MHz
Base Number Matches:1

RN1401(TE85R) 数据手册

 浏览型号RN1401(TE85R)的Datasheet PDF文件第2页浏览型号RN1401(TE85R)的Datasheet PDF文件第3页浏览型号RN1401(TE85R)的Datasheet PDF文件第4页浏览型号RN1401(TE85R)的Datasheet PDF文件第5页浏览型号RN1401(TE85R)的Datasheet PDF文件第6页浏览型号RN1401(TE85R)的Datasheet PDF文件第7页 
RN1401RN1406  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1401, RN1402, RN1403  
RN1404, RN1405, RN1406  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit  
And Driver Circuit Applications  
z With built-in bias resistors  
z Simplified circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2401~RN2406  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k  
R2 (kΩ  
RN1401  
RN1402  
RN1403  
RN1404  
RN1405  
RN1406  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
22  
47  
JEDEC  
TO-236MOD  
2.2  
4.7  
JEITA  
SC-59  
TOSHIBA  
2-3F1A  
Weight: 0.012g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1401~1406  
Collector-emitter voltage  
RN1401~1404  
RN1405, 1406  
10  
Emitter-base voltage  
V
V
EBO  
5
Collector current  
I
100  
200  
150  
55~150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN1401~1406  
T
j
T
stg  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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