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RD48F2000W0ZBQ0 PDF预览

RD48F2000W0ZBQ0

更新时间: 2024-11-14 21:08:43
品牌 Logo 应用领域
英特尔 - INTEL 内存集成电路闪存
页数 文件大小 规格书
98页 1119K
描述
Flash, 4MX16, 20ns, PBGA88, SCSP-88

RD48F2000W0ZBQ0 技术参数

是否Rohs认证: 不符合生命周期:Transferred
零件包装代码:BGA包装说明:TFBGA, BGA88,8X12,32
针数:88Reach Compliance Code:compliant
ECCN代码:3A991.B.1.AHTS代码:8542.32.00.51
风险等级:5.71最长访问时间:20 ns
其他特性:SYNCHRONOUS BURST MODE OPERATION ALSO POSSIBLE启动块:BOTTOM
命令用户界面:YES通用闪存接口:YES
数据轮询:NOJESD-30 代码:R-PBGA-B88
JESD-609代码:e0长度:10 mm
内存密度:67108864 bit内存集成电路类型:FLASH
内存宽度:16功能数量:1
部门数/规模:8,127端子数量:88
字数:4194304 words字数代码:4000000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:4MX16
封装主体材料:PLASTIC/EPOXY封装代码:TFBGA
封装等效代码:BGA88,8X12,32封装形状:RECTANGULAR
封装形式:GRID ARRAY, THIN PROFILE, FINE PITCH页面大小:4 words
并行/串行:PARALLEL峰值回流温度(摄氏度):240
电源:1.8/3 V编程电压:1.8 V
认证状态:Not Qualified座面最大高度:1.2 mm
部门规模:4K,32K最大待机电流:0.000005 A
子类别:Flash Memories最大压摆率:0.04 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:0.8 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:30切换位:NO
类型:NOR TYPE宽度:8 mm
Base Number Matches:1

RD48F2000W0ZBQ0 数据手册

 浏览型号RD48F2000W0ZBQ0的Datasheet PDF文件第2页浏览型号RD48F2000W0ZBQ0的Datasheet PDF文件第3页浏览型号RD48F2000W0ZBQ0的Datasheet PDF文件第4页浏览型号RD48F2000W0ZBQ0的Datasheet PDF文件第5页浏览型号RD48F2000W0ZBQ0的Datasheet PDF文件第6页浏览型号RD48F2000W0ZBQ0的Datasheet PDF文件第7页 
Intel® Wireless Flash Memory (W30)  
28F640W30, 28F320W30, 28F128W30  
Datasheet  
Product Features  
High Performance Read-While-Write/Erase  
— Burst Frequency at 40 MHz  
— 70 ns Initial Access Speed  
— 25 ns Page-Mode Read Speed  
— 20 ns Burst-Mode Read Speed  
— Burst- and Page-Mode in All Blocks and  
across All Partition Boundaries  
— Burst Suspend Feature  
— Enhanced Factory Programming:  
3.5 µs per Word Program Time  
— Programmable WAIT Signal Polarity  
Flash Power  
Flash Architecture  
— Multiple 4-Mbit Partitions  
— Dual Operation: RWW or RWE  
— Parameter Block Size = 4-Kword  
— Main block size = 32-Kword  
— Top and Bottom Parameter Devices  
Flash Security  
— 128-bit Protection Register: 64 Unique Device  
Identifier Bits; 64 User OTP Protection  
Register Bits  
— Absolute Write Protection with VPP at Ground  
— Program and Erase Lockout during Power  
Transitions  
— VCC = 1.70 V – 1.90 V  
— VCCQ = 2.20 V – 3.30 V  
— Standby Current (130 nm) = 8 µA (typ.)  
— Read Current = 7 mA  
— Individual and Instantaneous Block Locking/  
Unlocking with Lock-Down  
Density and Packaging  
(4 word burst, typ.)  
Flash Software  
— 130 nm: 32Mb, 64Mb, and 128Mb in VF BGA  
Package; 64Mb, 128Mb in QUAD+ Package  
— 180 nm: 32Mb and 128Mb Densities in VF  
BGA Package; 64Mb Density in µBGA*  
Package  
— 5 µs/9 µs (typ.) Program/Erase Suspend  
Latency Time  
— Intel® Flash Data Integrator (FDI) and  
Common Flash Interface (CFI) Compatible  
Quality and Reliability  
— 56 Active Ball Matrix, 0.75 mm Ball-Pitch  
— 16-bit Data Bus  
— Operating Temperature:  
–40 °C to +85 °C  
— 100K Minimum Erase Cycles  
— 130 nm ETOX™ VIII Process  
— 180 nm ETOX™ VII Process  
The Intel®Wireless Flash Memory (W30) device combines state-of-the-art Intel® Flash  
technology to provide the most versatile memory solution for high performance, low power,  
board constraint memory applications. The W30 device offers a multi-partition, dual-operation  
flash architecture that enables the device to read from one partition while programming or  
erasing in another partition. This Read-While-Write or Read-While-Erase capability makes it  
possible to achieve higher data throughput rates as compared to single partition devices,  
allowing two processors to interleave code execution because program and erase operations can  
now occur as background processes.  
The W30 device incorporates a new Enhanced Factory Programming (EFP) mode to improve 12  
V factory programming performance. This new feature helps eliminate manufacturing  
bottlenecks associated with programming high density flash devices. Compare the EFP program  
time of 3.5 µs per word to the standard factory program time of 8.0 µs per word and save  
significant factory programming time for improved factory efficiency.  
Additionally, the W30 device includes block lock-down and programmable WAIT signal  
polarity, and is supported by an array of software tools. All these features make this product a  
perfect solution for any demanding memory application.  
Notice: This document contains information on new products in production. The specifications  
are subject to change without notice. Verify with your local Intel sales office that you have the lat-  
est datasheet before finalizing a design.  
290702-010  
December2004  

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