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RD38F4050L0ZBQ0 PDF预览

RD38F4050L0ZBQ0

更新时间: 2024-11-08 18:56:07
品牌 Logo 应用领域
英特尔 - INTEL 静态存储器内存集成电路
页数 文件大小 规格书
54页 966K
描述
Memory Circuit, Flash+PSRAM, 16MX16, CMOS, PBGA88, 8 X 10 MM, SCSP-88

RD38F4050L0ZBQ0 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:TFBGA, BGA88,8X12,32
针数:88Reach Compliance Code:compliant
HTS代码:8542.32.00.71风险等级:5.92
最长访问时间:85 ns其他特性:CONTAINS 64M BIT PSRAM
JESD-30 代码:R-PBGA-B88JESD-609代码:e0
长度:10 mm内存密度:268435456 bit
内存集成电路类型:MEMORY CIRCUIT内存宽度:16
混合内存类型:FLASH+PSRAM功能数量:1
端子数量:88字数:16777216 words
字数代码:16000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-25 °C
组织:16MX16封装主体材料:PLASTIC/EPOXY
封装代码:TFBGA封装等效代码:BGA88,8X12,32
封装形状:RECTANGULAR封装形式:GRID ARRAY, THIN PROFILE, FINE PITCH
峰值回流温度(摄氏度):NOT SPECIFIED电源:1.8,3 V
认证状态:Not Qualified座面最大高度:1.2 mm
最大待机电流:0.00015 A子类别:Other Memory ICs
最大压摆率:0.045 mA最大供电电压 (Vsup):2 V
最小供电电压 (Vsup):1.7 V标称供电电压 (Vsup):1.8 V
表面贴装:YES技术:CMOS
温度等级:OTHER端子面层:Tin/Lead (Sn/Pb)
端子形式:BALL端子节距:0.8 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:8 mmBase Number Matches:1

RD38F4050L0ZBQ0 数据手册

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£
Intel StrataFlash Wireless Memory  
System (LV18/LV30 SCSP)  
768-Mbit LVQ Family with Asynchronous Static RAM  
Datasheet  
Product Features  
Device Architecture  
xRAM Performance  
Code and data segment: 128- and 256-  
Mbit density; PSRAM: 32- and 64-Mbit  
density; SRAM: 8 Mbit density.  
PSRAM at 1.8 V I/O : 85 ns initial  
access, 30 ns async page reads; 65 ns  
initial access, 18 ns async page.  
Top or bottom parameter configuration.  
Asymmetrical blocking structure.  
SRAM at 1.8 or 3.0 V I/O: 70 ns initial  
access.  
Flash Performance  
16-KWord parameter blocks (Top or  
Bottom); 64-K Word main blocks.  
Code Segment at 1.8 V I/O: 85 ns initial  
access; 25 ns async page read; 14 ns  
sync reads (tCHQV); 54 MHz CLK.  
Zero-latency block locking.  
Absolute write protection with block  
lock down using F-WP#.  
Data Segment at 1.8 V I/O: 170 ns initial  
access; 55 ns async page read.  
Device Voltage  
Flash Architecture  
Core: VCC = 1.8 V (typ).  
Hardware Read-While-Write/Erase.  
8-Mbit or 16-Mbit Multi-Partition.  
I/O: VCCQ = 1.8 V or 3.0 V (typ).  
Device Concurrent Operations (3 Dies)  
Buffered EFP: 600 KB per second.  
2-Kbit One-Time Programmable (OTP)  
Protection Register.  
Erase Performance: 384 KB per second  
(main blocks).  
Software Read-While-Write/Erase.  
Single Full-Die Partition size.  
Flash Software  
£
Device Packaging  
88 balls (8 x 10 active ball matrix).  
Area: 8 x 10 mm or 8 x 11 mm.  
Height: 1.0 mm to 1.4 mm.  
£
£
Intel FDI, Intel PSM, and Intel  
VFM.  
Common Flash Interface (CFI).  
Basic/Extended Command Set.  
Quality and Reliability  
Extended Temp: 25 °C to +85 °C.  
Minimum 100 K flash block erase cycle.  
The Intel StrataFlash® Wireless Memory System (LV18/LV30 SCSP); 768-Mbit LVQ Family  
with Asynchronous Static RAM device offers a high performance code and large embedded data  
segment plus RAM combination in a common package with electrical QUAD+ ballout on 0.13  
µm ETOX™ VIII flash technology. The code segment flash die features 1.8 V low-power  
operations with flexible, multi-partition, dual operation Read-While-Write / Read-While-Erase,  
asynchronous and synchronous burst reads at 54 MHz. The data segment flash die features 1.8 V  
low-power operations optimized for cost sensitive asynchronous data applications. This device  
integrates up to three flash dies, two PSRAM dies, and one SRAM die in a low-profile package  
compatible with other SCSP families using the QUAD+ ballout package.  
Notice: This document contains information on new products in production. The specifications  
are subject to change without notice. Verify with your local Intel sales office that you have the lat-  
est datasheet before finalizing a design.  
253852-002  
December 2003  

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