DATA SHEET
www.onsemi.com
MOSFET - Power, Single
N-Channel
V
R
MAX
I MAX
D
(BR)DSS
DS(ON)
3.6 mW @ 10 V
5.8 mW @ 4.5 V
100 V
132 A
100 V, 3.6 mW, 132 A
NVMFS3D6N10MCL
D (5,6)
Features
• Small Footprint (5x6 mm) for Compact Design
G (4)
• Low R
to Minimize Conduction Losses
DS(on)
• Low Q and Capacitance to Minimize Driver Losses
G
S (1,2,3)
• NVMFWS3D6N10MCL − Wettable Flank Option for Enhanced
Optical Inspection
N−CHANNEL MOSFET
• AEC−Q101 Qualified and PPAP Capable
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
1
Parameter
Drain−to−Source Voltage
Symbol
Value
100
20
Unit
V
DFN5 5x6, 1.27P (SO−8FL)
V
DSS
CASE 488AA
Gate−to−Source Voltage
V
GS
V
Continuous Drain
Current R
T
= 25°C
I
D
132
A
C
Steady
State
q
JC
T
C
= 100°C
84
(Notes 1, 3)
Power Dissipation
T
= 25°C
P
139
56
W
A
C
D
D
Steady
State
R
(Note 1)
q
JC
T
C
= 100°C
DFNW5 5x6 (FULL−CUT SO8FL WF)
Continuous Drain
Current R
T = 25°C
A
I
D
20
Steady
State
CASE 507BA
q
JA
T = 100°C
A
13
(Notes 1, 2, 3)
Power Dissipation
T = 25°C
A
P
3.2
1.3
888
W
Steady
State
R
(Notes 1, 2)
q
JA
T = 100°C
A
MARKING DIAGRAM
Pulsed Drain Current
T = 25°C, t = 10 ms
I
A
A
p
DM
D
Operating Junction and Storage Temperature
Range
T , T
−55 to
°C
S
S
S
G
D
D
J
stg
+175
XXXXXX
AYWZZ
Source Current (Body Diode)
IS
116
739
A
Single Pulse Drain−to−Source Avalanche
E
AS
mJ
D
Energy (I = 9.2 A)
AS
XXXXXX = Specific Device Code
Lead Temperature for Soldering Purposes
T
260
°C
L
A
Y
= Assembly Location
= Year
(1/8″ from case for 10 s)
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
W
ZZ
= Work Week
= Lot Traceability
THERMAL RESISTANCE MAXIMUM RATINGS
Parameter
Symbol
Value
0.9
Unit
ORDERING INFORMATION
See detailed ordering, marking and shipping information in the
package dimensions section on page 5 of this data sheet.
Junction−to−Case − Steady State
Junction−to−Ambient − Steady State (Note 2)
R
°C/W
q
JC
R
39
q
JA
1. The entire application environment impacts the thermal resistance values shown,
they are not constants and are only valid for the particular conditions noted.
2
2. Surface−mounted on FR4 board using a 650 mm , 2 oz. Cu pad.
3. Maximum current for pulses as long as 1 second is higher but is dependent
on pulse duration and duty cycle.
© Semiconductor Components Industries, LLC, 2019
1
Publication Order Number:
April, 2022 − Rev. 4
NVMFS3D6N10MCL/D