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NE552R479A-T1A-A PDF预览

NE552R479A-T1A-A

更新时间: 2024-11-28 21:53:51
品牌 Logo 应用领域
CEL 晶体晶体管放大器
页数 文件大小 规格书
9页 497K
描述
NECs 3.0 V, 0.25 W L&S-BAND MEDIUM POWER SILICON LD-MOSFET

NE552R479A-T1A-A 数据手册

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NEC's 3.0 V, 0.25 W L&S-BAND  
MEDIUM POWER SILICON LD-MOSFET  
NE552R479A  
OUTLINE DIMENSIONS (Units in mm)  
FEATURES  
• LOW COST PLASTIC SURFACE MOUNT PACKAGE  
• HIGH OUTPUT POWER: +26 dBm TYP at VDS = 3.0 V  
• HIGH LINEAR GAIN: 11 dB TYP @ 2.45 GHz  
• SINGLE SUPPLY: 2.8 to 6 V  
PACKAGE OUTLINE 79A  
(Bottom View)  
4.2 MAX.  
Source  
1.5±0.2  
Source  
• SURFACE MOUNT PACKAGE: 5.7x5.7x1.1 mm MAX  
Gate  
Drain  
Gate  
Drain  
0.4±0.15  
5.7 MAX.  
0.8 MAX.  
3.6±0.2  
DESCRIPTION  
APPLICATIONS  
NEC's NE552R479A is an N-Channel silicon power laterally  
diffused MOSFET specially designed as the transmission  
power amplifier for mobile and fixed wireless applications.  
Die are manufactured using NEC's NEWMOS2 technology  
(NEC's 0.6 μm WSi gate lateral MOSFET) and housed in a  
surface mount package.  
• DIGITAL CELLULAR PHONES:  
3.0 V GSM1900 Pre Driver  
• ANALOG CELLULAR PHONES:  
2.4 V AMPS Handsets  
• OTHERS:  
W-LAN  
Short Range Wireless  
Retail Business Radio  
Special Mobile Radio  
ELECTRICAL CHARACTERISTICS (TA = 25°C)  
PART NUMBER  
NE552R479A  
79A  
PACKAGE OUTLINE  
SYMBOLS  
POUT  
GL  
CHARACTERISTICS  
Output Power  
UNITS  
dBm  
dB  
MIN  
TYP  
26.0  
11.0  
45  
MAX  
TEST CONDITIONS  
24.0  
f = 2.45 GHz, VDS = 3.0 V,  
IDSQ = 200 mA (RF OFF)  
Pin = 19 dBm, except  
Linear Gain  
ηADD  
ID  
Power Added Efficiency  
Drain Current  
%
35  
Pin = 10 dBm for linear gain  
A
230  
IGSS  
Gate-to-Source Leakage Current  
nA  
100  
100  
VGS = 5.0 V  
VDS = 6.0 V  
IDSS  
Saturated Drain Current  
nA  
(Zero Gate Voltage Drain Voltage)  
VTH  
gm  
Gate Threshold Voltage  
Transconductance  
V
S
1
1.4  
0.4  
18  
1.9  
VDS = 3.5 V, IDS = 1 mA  
VDS = 3.5 V, IDS = 100 mA  
IDSS = 10 μA  
BVDSS  
RTH  
Drain-to-Source Breakdown Voltage  
Thermal Resistance  
V
15  
°C/W  
10  
Channel-to-Case  
Notes:  
1. DC performance is tested 100%. Several samples per wafer are tested for RF performance. Wafer rejection criteria for standard devices is 1  
reject for several samples.  
California Eastern Laboratories  

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