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NDS8426

更新时间: 2024-02-09 04:47:26
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 晶体小信号场效应晶体管开关光电二极管
页数 文件大小 规格书
10页 267K
描述
Single N-Channel Enhancement Mode Field Effect Transistor

NDS8426 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:,Reach Compliance Code:compliant
风险等级:5.83配置:Single
最大漏极电流 (Abs) (ID):11 AFET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-609代码:e3湿度敏感等级:1
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
极性/信道类型:N-CHANNEL子类别:FET General Purpose Power
表面贴装:YES端子面层:Matte Tin (Sn)
Base Number Matches:1

NDS8426 数据手册

 浏览型号NDS8426的Datasheet PDF文件第2页浏览型号NDS8426的Datasheet PDF文件第3页浏览型号NDS8426的Datasheet PDF文件第4页浏览型号NDS8426的Datasheet PDF文件第5页浏览型号NDS8426的Datasheet PDF文件第6页浏览型号NDS8426的Datasheet PDF文件第7页 
September 1997  
NDS8426  
Single N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
9.9 A, 20 V. RDS(ON) = 0.015 W @ VGS= 4.5 V.  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild's proprietary, high cell  
density, DMOS technology. This very high density process is  
especially tailored to minimize on-state resistance and provide  
superior switching performance. These devices are particularly  
suited for low voltage applications such as notebook computer  
power management and other battery powered circuits where  
fast switching, low in-line power loss, and resistance to  
transients are needed.  
RDS(ON) = 0.020 W @ VGS= 2.7 V.  
High density cell design for extremely low RDS(ON)  
.
High power and current handling capability in a widely used  
surface mount package.  
____________________________________________________________________________________________  
5
6
4
3
2
1
7
8
ABSOLUTE MAXIMUM RATINGS TA = 25°C unless otherwise noted  
Symbol Parameter  
NDS8426  
Units  
VDSS  
VGSS  
ID  
Drain-Source Voltage  
Gate-Source Voltage  
20  
8
V
V
A
Drain Current - Continuous  
- Pulsed  
(Note 1a)  
9.9  
20  
2.5  
PD  
Maximum Power Dissipation  
(Note 1a)  
(Note 1b)  
W
1.2  
(Note 1c)  
1
TJ,TSTG  
Operating and Storage Temperature Range  
-55 to 150  
°C  
THERMAL CHARACTERISTICS  
RqJA  
RqJC  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
50  
25  
°C/W  
°C/W  
© 1997 Fairchild Semiconductor Corporation  
NDS8426 Rev.E  

NDS8426 替代型号

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