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K7I320882M-FC160 PDF预览

K7I320882M-FC160

更新时间: 2024-11-20 20:04:43
品牌 Logo 应用领域
三星 - SAMSUNG 双倍数据速率静态存储器内存集成电路
页数 文件大小 规格书
18页 179K
描述
DDR SRAM, 4MX8, 0.5ns, CMOS, PBGA165, 15 X 17 MM, 1 MM PITCH, FBGA-165

K7I320882M-FC160 技术参数

生命周期:Obsolete零件包装代码:BGA
包装说明:LBGA,针数:165
Reach Compliance Code:unknownECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.84
最长访问时间:0.5 ns其他特性:PIPELINED ARCHITECTURE
JESD-30 代码:R-PBGA-B165长度:17 mm
内存密度:33554432 bit内存集成电路类型:DDR SRAM
内存宽度:8功能数量:1
端子数量:165字数:4194304 words
字数代码:4000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:4MX8封装主体材料:PLASTIC/EPOXY
封装代码:LBGA封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
认证状态:Not Qualified座面最大高度:1.4 mm
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM宽度:15 mm
Base Number Matches:1

K7I320882M-FC160 数据手册

 浏览型号K7I320882M-FC160的Datasheet PDF文件第2页浏览型号K7I320882M-FC160的Datasheet PDF文件第3页浏览型号K7I320882M-FC160的Datasheet PDF文件第4页浏览型号K7I320882M-FC160的Datasheet PDF文件第5页浏览型号K7I320882M-FC160的Datasheet PDF文件第6页浏览型号K7I320882M-FC160的Datasheet PDF文件第7页 
K7I323682M  
K7I321882M  
K7I320882M  
1Mx36 & 2Mx18 & 4Mx8 DDRII CIO b2 SRAM  
Document Title  
1Mx36-bit, 2Mx18-bit, 4Mx8-bit DDRII CIO b2 SRAM  
Revision History  
Rev. No.  
History  
Draft Date  
Remark  
0.0  
1. Initial document.  
Advance  
Preliminary  
October, 22 2001  
December, 12 2001  
0.1  
1. Pin name change from DLL to Doff.  
2. Vddq range change from 1.5V to 1.5V~1.8V.  
3. Update JTAG test conditions.  
4. Reserved pin for high density name change from NC to Vss/SA  
5. Delete AC test condition about Clock Input timing Reference Level  
6. Delete clock description on page 2 and add HSTL I/O comment  
0.2  
0.3  
0.4  
1. Update current characteristics in DC electrical characteristics  
2. Change AC timing characteristics  
Preliminary  
Preliminary  
Preliminary  
July, 29. 2002  
Sep. 6. 2002  
Oct. 7. 2002  
3. Update JTAG instruction coding and diagrams  
1. Add AC electrical characteristics.  
2. Change AC timing characteristics.  
3. Change DC electrical characteristics(ISB1)  
1. Change the data Setup/Hold time.  
2. Change the Access Time.(tCHQV, tCHQX, etc.)  
3. Change the Clock Cycle Time.(MAX value of tKHKH)  
4. Change the JTAG instruction coding.  
0.5  
1. Change the Boundary scan exit order.  
Preliminary  
Dec. 16, 2002  
2. Change the AC timing characteristics(-25, -20)  
3. Correct the Overshoot and Undershoot timing diagrams.  
0.6  
0.7  
0.8  
1. Correct the JTAG ID register definition  
2. Correct the AC timing parameter (delete the tKHKH Max value)  
Preliminary  
Preliminary  
Preliminary  
Mar. 20, 2003  
April. 4, 2003  
Oct. 29, 2003  
1. Change the Maximum Clock cycle time.  
2. Correct the 165FBGA package ball size.  
1. Change the operating current parameter.  
before  
620  
520  
440  
560  
470  
410  
540  
450  
390  
200  
180  
160  
after  
700  
600  
500  
670  
570  
470  
650  
550  
450  
230  
200  
190  
Icc(x36) -25 :  
-20 :  
-16 :  
Icc(x18) -25 :  
-20 :  
-16 :  
Icc(x 8 ) -25 :  
-20 :  
-16 :  
Isb1  
-25 :  
-20 :  
-16 :  
1.0  
1. Final spec release  
Final  
Oct. 31, 2003  
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the  
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-  
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.  
Oct. 2003  
Rev 1.0  
- 1 -  

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K7I320884M-FC160 SAMSUNG

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DDR SRAM, 4MX8, 0.5ns, CMOS, PBGA165, 15 X 17 MM, 1 MM PITCH, FBGA-165
K7I320884M-FC16T SAMSUNG

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Application Specific SRAM, 4MX8, 0.5ns, CMOS, PBGA165, 15 X 17 MM, 1 MM PITCH, FBGA-165
K7I320884M-FC20 SAMSUNG

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DDR SRAM, 4MX8, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1 MM PITCH, FBGA-165
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DDR SRAM, 4MX8, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1 MM PITCH, FBGA-165