是否无铅: | 不含铅 | 是否Rohs认证: | 符合 |
生命周期: | Obsolete | 包装说明: | FBGA, BGA60,9X11,32 |
Reach Compliance Code: | unknown | 风险等级: | 5.84 |
最长访问时间: | 0.4 ns | 最大时钟频率 (fCLK): | 400 MHz |
I/O 类型: | COMMON | 交错的突发长度: | 4,8 |
JESD-30 代码: | R-PBGA-B60 | JESD-609代码: | e3 |
内存密度: | 1073741824 bit | 内存集成电路类型: | DDR DRAM |
内存宽度: | 8 | 湿度敏感等级: | 1 |
端子数量: | 60 | 字数: | 134217728 words |
字数代码: | 128000000 | 组织: | 128MX8 |
输出特性: | 3-STATE | 封装主体材料: | PLASTIC/EPOXY |
封装代码: | FBGA | 封装等效代码: | BGA60,9X11,32 |
封装形状: | RECTANGULAR | 封装形式: | GRID ARRAY, FINE PITCH |
峰值回流温度(摄氏度): | 225 | 电源: | 1.8 V |
认证状态: | Not Qualified | 刷新周期: | 8192 |
连续突发长度: | 4,8 | 子类别: | DRAMs |
最大压摆率: | 0.265 mA | 标称供电电压 (Vsup): | 1.8 V |
表面贴装: | YES | 技术: | CMOS |
端子面层: | MATTE TIN | 端子形式: | BALL |
端子节距: | 0.8 mm | 端子位置: | BOTTOM |
处于峰值回流温度下的最长时间: | NOT SPECIFIED | Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
K4T1G084QD-ZLE70 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.4ns, CMOS, PBGA60, ROHS COMPLIANT, FBGA-60 | |
K4T1G084QD-ZLE7T | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.4ns, CMOS, PBGA60 | |
K4T1G084QD-ZLF70 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.4ns, CMOS, PBGA60, ROHS COMPLIANT, FBGA-60 | |
K4T1G084QD-ZLF7T | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.4ns, CMOS, PBGA60 | |
K4T1G084QE | SAMSUNG |
获取价格 |
Consumer Memory | |
K4T1G084QE-HCE6 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.45ns, CMOS, PBGA60, HALOGEN FREE AND ROHS COMPLIANT, FBGA-60 | |
K4T1G084QE-HCE7 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.4ns, CMOS, PBGA60, HALOGEN FREE AND ROHS COMPLIANT, FBGA-60 | |
K4T1G084QE-HCF8 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.35ns, CMOS, PBGA60, HALOGEN FREE AND ROHS COMPLIANT, FBGA-60 | |
K4T1G084QE-HCF8T | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.35ns, CMOS, PBGA60 | |
K4T1G084QE-HCLE6 | SAMSUNG |
获取价格 |
1Gb E-die DDR2 SDRAM |