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IS61DDB24M18A PDF预览

IS61DDB24M18A

更新时间: 2024-11-19 01:20:19
品牌 Logo 应用领域
美国芯成 - ISSI /
页数 文件大小 规格书
29页 770K
描述
Common I/O read and write ports

IS61DDB24M18A 数据手册

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IS61DDB24M18A  
IS61DDB22M36A  
4Mx18, 2Mx36  
AUGUST 2014  
72Mb DDR-II (Burst 2) CIO SYNCHRONOUS SRAM  
FEATURES  
DESCRIPTION  
The 72Mb IS61DDB22M36A and IS61DDB24M18A are  
synchronous, high-performance CMOS static random access  
memory (SRAM) devices. These SRAMs have a common I/O  
bus. The rising edge of K clock initiates the read/write  
operation, and all internal operations are self-timed. Refer to  
the Timing Reference Diagram for Truth Table for a  
description of the basic operations of these DDR-II (Burst of  
2) CIO SRAMs.  
2Mx36 and 4Mx18 configuration available.  
On-chip delay-locked loop (DLL) for wide data valid  
window.  
Common I/O read and write ports.  
Synchronous pipeline read with self-timed late write  
operation.  
Double Data Rate (DDR) interface for read and  
write input ports.  
Read and write addresses are registered on alternating rising  
edges of the K clock. Reads and writes are performed in  
double data rate.  
Fixed 2-bit burst for read and write operations.  
Clock stop support.  
The following are registered internally on the rising edge of  
the K clock:  
Two input clocks (K and K#) for address and control  
registering at rising edges only.  
Read/write address  
Read enable  
Write enable  
Byte writes for first burst address  
Data-in for first burst address  
Two input clocks (C and C#) for data output control.  
Two echo clocks (CQ and CQ#) that are delivered  
simultaneously with data.  
+1.8V core power supply and 1.5V to 1.8V VDDQ,  
used with 0.75V to 0.9V VREF.  
The following are registered on the rising edge of the K#  
clock:  
HSTL input and output interface.  
Registered addresses, write and read controls, byte  
writes, data in, and data outputs.  
Byte writes for second burst address  
Data-in for second burst address  
Full data coherency.  
Boundary scan using limited set of JTAG 1149.1  
functions.  
Byte writes can change with the corresponding data-in to  
enable or disable writes on a per-byte basis. An internal write  
buffer enables the data-ins to be registered one cycle after  
the write address. The first data-in burst is clocked one cycle  
later than the write command signal, and the second burst is  
timed to the following rising edge of the K# clock.  
Byte write capability.  
Fine ball grid array (FBGA) package:  
13mmx15mm and 15mmx17mm body size  
165-ball (11 x 15) array  
During the burst read operation, the data-outs from the first  
bursts are updated from output registers of the second rising  
edge of the C# clock (starting one and half cycles later after  
read command). The data-outs from the second bursts are  
updated with the third rising edge of the C clock. The K and  
K# clocks are used to time the data-outs whenever the C and  
C# clocks are tied high.  
Programmable impedance output drivers via 5x  
user-supplied precision resistor.  
The device is operated with a single +1.8V power supply and  
is compatible with HSTL I/O interfaces.  
Copyright © 2014 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can  
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such  
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:  
a.) the risk of injury or damage has been minimized;  
b.) the user assume all such risks; and  
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. A  
1
08/15/2014  

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