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IS61DDB42M18C-250B4LI PDF预览

IS61DDB42M18C-250B4LI

更新时间: 2024-11-19 05:26:23
品牌 Logo 应用领域
美国芯成 - ISSI 双倍数据速率静态存储器
页数 文件大小 规格书
30页 829K
描述
DDR SRAM, 2MX18, 0.45ns, CMOS, PBGA165, 13 X 15 MM, 1.40 MM HEIGHT, LEAD FREE, LFBGA-165

IS61DDB42M18C-250B4LI 数据手册

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IS61DDB42M18C  
IS61DDB41M36C  
2Mx18, 1Mx36  
36Mb DDR-II (Burst 4) CIO SYNCHRONOUS SRAM  
MARCH 2016  
DESCRIPTION  
FEATURES  
The 36Mb IS61DDB41M36C and IS61DDB42M18C are  
synchronous, high-performance CMOS static random access  
memory (SRAM) devices. These SRAMs have a common I/O  
bus. The rising edge of K clock initiates the read/write  
operation, and all internal operations are self-timed. Refer to  
the Timing Reference Diagram for Truth Table for a  
description of the basic operations of these DDR-II (Burst of  
4) CIO SRAMs.  
1Mx36 and 2Mx18 configuration available.  
On-chip delay-locked loop (DLL) for wide data valid  
window.  
Common I/O read and write ports.  
Synchronous pipeline read with late write operation.  
Double Data Rate (DDR) interface for read and  
write input ports.  
Read and write addresses are registered on alternating rising  
edges of the K clock. Reads and writes are performed in  
double data rate.  
Fixed 4-bit burst for read and write operations.  
Clock stop support.  
Two input clocks (K and K#) for address and control  
registering at rising edges only.  
The following are registered internally on the rising edge of  
the K clock:  
Two input clocks (C and C#) for data output control.  
Read/write address  
Read enable  
Write enable  
Byte writes for burst addresses first and third  
Data-in for burst addresses first and third  
Two echo clocks (CQ and CQ#) that are delivered  
simultaneously with data.  
+1.8V core power supply and 1.5V to1.8V VDDQ,  
used with 0.75V to 0.9V VREF.  
HSTL input and output interface.  
The following are registered on the rising edge of the K#  
clock:  
Registered addresses, write and read controls, byte  
writes, data in, and data outputs.  
Byte writes for burst addresses second and fourth  
Data-in for burst addresses second and fourth  
Full data coherency.  
Boundary scan using limited set of JTAG 1149.1  
functions.  
Byte writes can change with the corresponding data-in to  
enable or disable writes on a per-byte basis. An internal write  
buffer enables the data-ins to be registered one cycle after  
the write address. The first data-in burst is clocked one cycle  
later than the write command signal, and the second burst is  
timed to the following rising edge of the K# clock. Two full  
clock cycles are required to complete a write operation.  
Byte write capability.  
Fine ball grid array (FBGA) package:  
13mmx15mm and 15mmx17mm body size  
165-ball (11 x 15) array  
Programmable impedance output drivers via 5x  
user-supplied precision resistor.  
During the burst read operation, the data-outs from the first  
and third bursts are updated from output registers of the  
second and third rising edges of the C# clock (starting on and  
half cycles later after read command). The data-outs from the  
second and fourth bursts are updated with the third and  
fourth rising edges of the C clock. The K and K# clocks are  
used to time the data-outs whenever the C and C# clocks are  
tied high. Two full clock cycles are required to complete a  
read operation.  
The device is operated with a single +1.8V power supply and  
is compatible with HSTL I/O interfaces.  
Copyright © 2016 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can  
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such  
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:  
a.) the risk of injury or damage has been minimized;  
b.) the user assume all such risks; and  
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. A  
1
03/23/2016  

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