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IBM0316169CT3-11 PDF预览

IBM0316169CT3-11

更新时间: 2024-11-11 19:37:39
品牌 Logo 应用领域
国际商业机器公司 - IBM 时钟动态存储器光电二极管内存集成电路
页数 文件大小 规格书
100页 1216K
描述
Synchronous DRAM, 1MX16, 10ns, CMOS, PDSO50, 0.400 INCH, PLASTIC, TSOP2-50

IBM0316169CT3-11 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP2包装说明:TSOP2, TSOP50,.46,32
针数:50Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.02
风险等级:5.71Is Samacsys:N
访问模式:DUAL BANK PAGE BURST最长访问时间:10 ns
其他特性:AUTO/SELF REFRESH最大时钟频率 (fCLK):90 MHz
I/O 类型:COMMON交错的突发长度:1,2,4,8
JESD-30 代码:R-PDSO-G50JESD-609代码:e0
长度:20.95 mm内存密度:16777216 bit
内存集成电路类型:SYNCHRONOUS DRAM内存宽度:16
功能数量:1端口数量:1
端子数量:50字数:1048576 words
字数代码:1000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:1MX16输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:TSOP2
封装等效代码:TSOP50,.46,32封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE峰值回流温度(摄氏度):NOT SPECIFIED
电源:3.3 V认证状态:Not Qualified
刷新周期:4096座面最大高度:1.2 mm
自我刷新:YES连续突发长度:1,2,4,8,FP
最大待机电流:0.003 A子类别:DRAMs
最大压摆率:0.175 mA最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING端子节距:0.8 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:10.16 mmBase Number Matches:1

IBM0316169CT3-11 数据手册

 浏览型号IBM0316169CT3-11的Datasheet PDF文件第2页浏览型号IBM0316169CT3-11的Datasheet PDF文件第3页浏览型号IBM0316169CT3-11的Datasheet PDF文件第4页浏览型号IBM0316169CT3-11的Datasheet PDF文件第5页浏览型号IBM0316169CT3-11的Datasheet PDF文件第6页浏览型号IBM0316169CT3-11的Datasheet PDF文件第7页 
IBM0316409C 4M  
x 412/10, 3.3V, SR. IBM0316169C 1M x 1612/8, 3.3V, SR. IBM0316809C 2M x 812/9, 3.3V, SR.  
IBM0316409C IBM0316809C  
IBM0316169C  
16Mbit Synchronous DRAM  
Features  
• High Performance:  
CAS latency = 3  
• Multiple Burst Read with Single Write Option  
• Automatic and Controlled Precharge Command  
• Data Mask for Read/Write control (x4,x8)  
• Dual Data Mask for byte control (x16)  
• Auto Refresh (CBR) and Self Refresh  
• Suspend Mode and Power Down Mode  
• 4096 refresh cycles/64ms  
-10 -11 -12 -13 Units  
fCK  
tCK3  
tAC3  
Clock Frequency  
Clock Cycle  
100 91  
83  
12  
11  
77  
13  
12  
MHz  
ns  
10  
9
11  
10  
Clock Access Time  
ns  
• Single Pulsed RAS Interface  
• Fully Synchronous to Positive Clock Edge  
• Dual Banks controlled by A11 (Bank Select)  
• Programmable CAS Latency: 1,2,3  
• Random Column Address every CLK (1-N Rule)  
• Single 3.3V ± 0.3V Power Supply  
• Programmable Burst Length: 1,2,4,8,full-page  
• LVTTL compatible  
• Programmable Wrap Sequence: Sequential or  
Interleave  
• Package: 40 pin 400 mil TSOP-Type II (x4,x8)  
50 pin 400 mil TSOP-Type II (x16)  
Description  
The  
IBM0316409C,  
IBM0316809C,  
and  
addresses (A0-A10) and a bank select address  
(A11) are strobed with RAS. Ten column addresses  
(A0-A9) plus a bank select address (A11) are  
strobed with CAS. Column address A9 is dropped  
on the x8 device and column addresses A8 and A9  
are dropped on the x16 device.  
IBM0316169C are dual bank Synchronous DRAM’s  
organized as 2Mbit x 4 I/O x 2 Bank, 1Mbit x 8 I/O x  
2 Bank, and 512Kbit x 16 I/O x 2 Bank, respectively.  
These synchronous devices achieve high speed  
data transfer rates of up to 100MHz by employing a  
chip architecture that prefetches multiple bits and  
then synchronizes the output data to a system clock.  
The chip is fabricated with IBM’s advanced 16Mbit  
single transistor CMOS DRAM process technology.  
The device is designed to comply with all  
JEDEC standards set for synchronous DRAM prod-  
ucts, both electrically and mechanically. All of the  
control, address and data input/output circuits are  
synchronized with the positive edge of an externally  
supplied clock.  
Prior to any access operation, the CAS latency,  
burst length, and burst sequence must be pro-  
grammed into the device by address inputs A0-A9  
during a mode register set cycle. In addition, it is  
possible to program a multiple burst sequence with  
single write cycle for write through cache operation.  
Operating the two memory banks in an inter-  
leave fashion allows random access operation to  
occur at a higher rate than is possible with standard  
DRAMs. A sequential and gapless data rate of up to  
100MHz is possible depending on burst length, CAS  
latency, and speed grade of the device.  
RAS, CAS, WE, and CS are pulsed signals  
which are examined at the positive edge of each  
externally applied clock (CLK). Internal chip operat-  
ing modes are defined by combinations of these sig-  
Auto Refresh (CBR) and Self Refresh operation  
are supported. These devices operate with a single  
3.3V ± 0.3V power supply and are available in  
400mil TSOP Type II packages.  
nals and  
a
command decoder initiates the  
necessary timings for each operation. A twelve bit  
address bus accepts address data in the conven-  
tional RAS/CAS multiplexing style. Eleven row  
©IBM Corporation, 1996. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
07H3997  
SA14-4711-02  
Revised 05/96  
Page 1 of 100  

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