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HYB25D512800AT-8 PDF预览

HYB25D512800AT-8

更新时间: 2024-11-18 20:08:15
品牌 Logo 应用领域
英飞凌 - INFINEON 动态存储器双倍数据速率光电二极管内存集成电路
页数 文件大小 规格书
75页 2025K
描述
DDR DRAM, 64MX8, 0.8ns, CMOS, PDSO66, 0.400 INCH, PLASTIC, TSOP2-66

HYB25D512800AT-8 技术参数

是否Rohs认证:不符合生命周期:Obsolete
零件包装代码:TSOP2包装说明:TSOP2,
针数:66Reach Compliance Code:compliant
ECCN代码:EAR99HTS代码:8542.32.00.28
风险等级:5.74Is Samacsys:N
访问模式:FOUR BANK PAGE BURST最长访问时间:0.8 ns
其他特性:AUTO/SELF REFRESHJESD-30 代码:R-PDSO-G66
长度:22.22 mm内存密度:536870912 bit
内存集成电路类型:DDR DRAM内存宽度:8
功能数量:1端口数量:1
端子数量:66字数:67108864 words
字数代码:64000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:64MX8封装主体材料:PLASTIC/EPOXY
封装代码:TSOP2封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE峰值回流温度(摄氏度):NOT SPECIFIED
认证状态:Not Qualified座面最大高度:1.2 mm
自我刷新:YES最大供电电压 (Vsup):2.7 V
最小供电电压 (Vsup):2.3 V标称供电电压 (Vsup):2.5 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子形式:GULL WING
端子节距:0.65 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:10.16 mm
Base Number Matches:1

HYB25D512800AT-8 数据手册

 浏览型号HYB25D512800AT-8的Datasheet PDF文件第2页浏览型号HYB25D512800AT-8的Datasheet PDF文件第3页浏览型号HYB25D512800AT-8的Datasheet PDF文件第4页浏览型号HYB25D512800AT-8的Datasheet PDF文件第5页浏览型号HYB25D512800AT-8的Datasheet PDF文件第6页浏览型号HYB25D512800AT-8的Datasheet PDF文件第7页 
HYB25D512400/800/160AT(L)  
512-MBit Double Data Rata SDRAM  
Preliminary Datasheet V0.91, 2002-11-14  
Features  
• DLL aligns DQ and DQS transitions with CK  
transitions  
CAS Latency and Frequency  
Maximum Operating Frequency (MHz)  
• Commands entered on each positive CK edge;  
data and data mask referenced to both edges of  
DQS  
CAS Latency  
DDR200  
-8  
DDR266A  
-7  
DDR333  
-6  
2
100  
125  
133  
143  
133  
166  
2.5  
• Burst Lengths: 2, 4, or 8  
• CAS Latency: (1.5), 2, 2.5, 3  
• Double data rate architecture: two data transfers  
per clock cycle  
• Auto Precharge option for each burst access  
• Auto Refresh and Self Refresh Modes  
• Bidirectional data strobe (DQS) is transmitted  
and received with data, to be used in capturing  
data at the receiver  
• 7.8s Maximum Average Periodic Refresh  
Interval  
• DQS is edge-aligned with data for reads and is  
center-aligned with data for writes  
• 2.5V (SSTL_2 compatible) I/O  
• VDDQ = 2.5V Mꢁ0.2V  
• VDD = 2.5V Mꢁ0.2V  
• Differential clock inputs (CK and CK)  
• Four internal banks for concurrent operation  
• Data mask (DM) for write data  
• TSOP66 package  
Description  
The 512Mb DDR SDRAM is a high-speed CMOS,  
dynamic random-access memory containing 536,870,912  
bits. It is internally configured as a quad-bank DRAM.  
dent with the Read or Write command are used to select  
the bank and the starting column location for the burst  
access.  
The 512Mb DDR SDRAM uses a double-data-rate archi-  
tecture to achieve high-speed operation. The double data  
rate architecture is essentially a 2n prefetch architecture  
with an interface designed to transfer two data words per  
clock cycle at the I/O pins. A single read or write access  
for the 512Mb DDR SDRAM effectively consists of a sin-  
gle 2n-bit wide, one clock cycle data transfer at the inter-  
nal DRAM core and two corresponding n-bit wide, one-  
half-clock-cycle data transfers at the I/O pins.  
The DDR SDRAM provides for programmable Read or  
Write burst lengths of 2, 4 or 8 locations. An Auto Pre-  
charge function may be enabled to provide a self-timed  
row precharge that is initiated at the end of the burst  
access.  
As with standard SDRAMs, the pipelined, multibank archi-  
tecture of DDR SDRAMs allows for concurrent operation,  
thereby providing high effective bandwidth by hiding row  
precharge and activation time.  
A bidirectional data strobe (DQS) is transmitted externally,  
along with data, for use in data capture at the receiver.  
DQS is a strobe transmitted by the DDR SDRAM during  
Reads and by the memory controller during Writes. DQS  
is edge-aligned with data for Reads and center-aligned  
with data for Writes.  
An auto refresh mode is provided along with a power-sav-  
ing power-down mode. All inputs are compatible with the  
JEDEC Standard for SSTL_2. All outputs are SSTL_2,  
Class II compatible.  
Note: The functionality described and the timing specifi-  
cations included in this data sheet are for the DLL Enabled  
mode of operation.  
The 512Mb DDR SDRAM operates from a differential  
clock (CK and CK; the crossing of CK going HIGH and CK  
going LOW is referred to as the positive edge of CK).  
Commands (address and control signals) are registered at  
every positive edge of CK. Input data is registered on both  
edges of DQS, and output data is referenced to both  
edges of DQS, as well as to both edges of CK.  
Read and write accesses to the DDR SDRAM are burst  
oriented; accesses start at a selected location and con-  
tinue for a programmed number of locations in a pro-  
grammed sequence. Accesses begin with the registration  
of an Active command, which is then followed by a Read  
or Write command. The address bits registered coincident  
with the Active command are used to select the bank and  
row to be accessed. The address bits registered coinci-  
V0.91, 2002-11-14  
Page 1 of 77  

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