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HN7G09FE PDF预览

HN7G09FE

更新时间: 2024-09-15 03:42:23
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体驱动器开关小信号双极晶体管光电二极管
页数 文件大小 规格书
8页 251K
描述
Power Management Switch Applications, Inverter Circuit Applications, Driver Circuit Applications and Interface Circuit Applications

HN7G09FE 技术参数

生命周期:Obsolete包装说明:SMALL OUTLINE, R-PDSO-F6
针数:6Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.21.00.75
风险等级:5.78Is Samacsys:N
其他特性:BUILT-IN BIAS RESISTOR最大集电极电流 (IC):0.1 A
集电极-发射极最大电压:50 V配置:SINGLE WITH BUILT-IN FET AND RESISTOR
最小直流电流增益 (hFE):80JESD-30 代码:R-PDSO-F6
元件数量:1端子数量:6
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE极性/信道类型:NPN
表面贴装:YES端子形式:FLAT
端子位置:DUAL晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):250 MHz
Base Number Matches:1

HN7G09FE 数据手册

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HN7G09FE  
TOSHIBA Multichip Discrete Device  
HN7G09FE  
Power Management Switch Applications, Inverter Circuit  
Applications, Driver Circuit Applications and Interface  
Circuit Applications  
Unit: mm  
Q1 (transistor): RN1104F equivalent  
Q2 (MOSFET): SSM3K15FS equivalent  
Q1 (Transistor) Absolute Maximum Ratings  
(Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
50  
50  
V
V
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
1. EMITTER  
2. BASE  
3. DRAIN  
4. SOURCE  
5. GATE  
10  
V
I
100  
mA  
C
6. COLLECTOR  
Q2 (MOSFET) Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Drain-source voltage  
Symbol  
Rating  
Unit  
JEDEC  
V
20  
V
V
DS  
JEITA  
Gate-source voltage  
V
± 20  
100  
200  
GSS  
TOSHIBA  
2-2J1A  
DC  
I
D
DC drain current  
mA  
Weight:0.003 g (typ.)  
Pulse  
I
DP  
Q1, Q2 Common Ratings (Ta = 25°C)  
Characteristic  
Power dissipation  
Symbol  
(Note 1)  
Rating  
Unit  
P
C
100  
150  
mW  
°C  
Junction temperature  
T
j
Storage temperature range  
T
stg  
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating.  
Marking  
Equivalent Circuit (top view)  
6
5
4
77  
Q2  
Q1  
1
2
3
1
2007-11-01  

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