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HN1L03FU_07 PDF预览

HN1L03FU_07

更新时间: 2024-11-06 03:42:23
品牌 Logo 应用领域
东芝 - TOSHIBA 开关
页数 文件大小 规格书
7页 464K
描述
High Speed Switching Applications

HN1L03FU_07 数据手册

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HN1L03FU  
TOSHIBA Field Effect Transistor Silicon N·P Channel MOS Type  
HN1L03FU  
High Speed Switching Applications  
Analog Switch Applications  
Unit in mm  
Q1, Q2 common  
z Low threshold voltage  
Q1: Vth = 0.8~2.5V Q2: Vth =0.5~1.5V  
z High speed  
z Small package  
Q1 Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Drain-Source voltage  
Symbol  
Rating  
Unit  
V
50  
10  
50  
V
V
DS  
Gate-Source voltage  
Drain current  
V
GSS  
I
mA  
D
Q2 Absolute Maximum Ratings (Ta = 25°C)  
JEDEC  
EIAJ  
Characteristic  
Drain-Source voltage  
Symbol  
Rating  
Unit  
2-2J1C  
TOSHIBA  
Weight: 6.8mg  
V
20  
7  
V
V
DS  
Gate-Source voltage  
Drain current  
V
GSS  
Marking  
I
50  
mA  
D
Absolute Maximum Ratings (Q1, Q2 Common)  
(Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Drain power dissipation  
Channel temperature  
P
200  
150  
mW  
°C  
D*  
T
ch  
Equivalent Circuit  
(Top View)  
Storage temperature range  
T
stg  
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba  
Semiconductor Reliability Handbook (“Handling  
Precautions”/“Derating Concept and Methods”) and individual  
reliability data (i.e. reliability test report and estimated failure rate,  
etc).  
*
Total rating  
1
2007-11-01  

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