CY7C1366A/GVT71256C36
CY7C1367A/GVT71512C18
256K x 36/512K x 18 Pipelined SRAM
and a 2-bit counter for internal burst operation. All synchro-
Features
nous inputs are gated by registers controlled by
a
• Fast access times: 2.5 ns, 3.0 ns, and 3.5 ns
• Fast clock speed: 225 MHz, 200 MHz, 166 MHz, and
150 MHz
• Fast OE access times: 2.5 ns, 3.0 ns, and 3.5 ns
• Optimalforperformance(twocyclechipdeselect,depth
expansion without wait state)
• 3.3V –5% and +10% power supply
• 3.3V or 2.5V I/O supply
• 5V tolerant inputs except I/Os
positive-edge-triggered Clock Input (CLK). The synchronous
inputs include all addresses, all data inputs, address-pipelin-
ing Chip Enable (CE), depth-expansion Chip Enables (CE
2
and CE ), Burst Control Inputs (ADSC, ADSP, and ADV), Write
2
Enables (BWa, BWb, BWc, BWd, and BWE), and Global Write
(GW). However, the CE Chip Enable input is only available for
2
the TA(GVTI)/A(CY) package version.
Asynchronous inputs include the Output Enable (OE) and
Burst Mode Control (MODE). The data outputs (Q), enabled
by OE, are also asynchronous.
• Clamp diodes to V at all inputs and outputs
SS
Addresses and chip enables are registered with either Ad-
dress Status Processor (ADSP) or Address Status Controller
(ADSC) input pins. Subsequent burst addresses can be inter-
nally generated as controlled by the Burst Advance Pin (ADV).
• Common data inputs and data outputs
• Byte Write Enable and Global Write control
• Multiple chip enables for depth expansion:
three chip enables for TA(GVTI)/A(CY) package version
and two chip enables for B(GVTI)/BG(CY) and
T(GVTI)/AJ(CY) package versions
• Address pipeline capability
• Address, data and control registers
• Internally self-timed Write Cycle
• Burst control pins (interleaved or linear burst
sequence)
• Automatic power-down for portable applications
• JTAG boundary scan for B and T package version
Address, data inputs, and write controls are registered on-chip
to initiate a self-timed WRITE cycle. WRITE cycles can be one
to four bytes wide, as controlled by the write control inputs.
Individual byte write allows an individual byte to be written.
BWa controls DQa. BWb controls DQb. BWc controls DQc.
BWd controls DQd. BWa, BWb, BWc, and BWd can be active
only with BWE being LOW. GW being LOW causes all bytes
to be written. The x18 version only has 18 data inputs/outputs
(DQa and DQb) along with BWa and BWb (no BWc, BWd,
DQc, and DQd).
For the B(GVTI)/BG(CY) and T(GVTI)/AJ(CY) package ver-
sions, four pins are used to implement JTAG test capabilities:
Test Mode Select (TMS), Test Data-In (TDI), Test Clock (TCK),
and Test Data-Out (TDO). The JTAG circuitry is used to serially
shift data to and from the device. JTAG inputs use
LVTTL/LVCMOS levels to shift data during this testing mode of
operation. The TA package version does not offer the JTAG
capability.
• Low profile 119-bump, 14-mm x 22-mm PBGA (Ball Grid
Array) and 100-pin TQFP packages
Functional Description
The Cypress Synchronous Burst SRAM family employs
high-speed, low power CMOS designs using advanced
triple-layer polysilicon, double-layer metal technology. Each
memory cell consists of four transistors and two high valued
resistors.
The
CY7C1366A/GVT71256C36
and
CY7C1367A/
GVT71512C18 operate from a +3.3V power supply. All inputs
and outputs are LVTTL compatible.
The
CY7C1366A/GVT71256C36
and
CY7C1367A/
GVT71512C18 SRAMs integrate 262,144 x 36 and 524,288 x
18 SRAM cells with advanced synchronous peripheral circuitry
Selection Guide
7C1366A-225/
7C1366A-200/
71256C36-5
7C1367A-200/
71512C18-5
7C1366A-166/
71256C36-6
7C1367A-166/
71512C18-6
7C1366A-150/
71256C36-6.7
7C1367A-150/
71512C18-6.7
71256C36-4.4
7C1367A-225/
71512C18-4.4
Maximum Access Time (ns)
2.5
570
10
3.0
510
10
3.5
425
10
3.5
380
10
Maximum Operating Current (mA)
Maximum CMOS Standby Current (mA)
Commercial
Cypress Semiconductor Corporation
•
3901 North First Street
•
San Jose
•
CA 95134
•
408-943-2600
June 12, 2001
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