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GAN041-650WSB PDF预览

GAN041-650WSB

更新时间: 2024-09-26 11:15:47
品牌 Logo 应用领域
安世 - NEXPERIA /
页数 文件大小 规格书
12页 310K
描述
650 V, 35 mΩ Gallium Nitride (GaN) FET in a TO-247 packageProduction

GAN041-650WSB 技术参数

生命周期:ActiveReach Compliance Code:compliant
风险等级:5.75Base Number Matches:1

GAN041-650WSB 数据手册

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GAN041-650WSB  
650 V, 35 mΩ Gallium Nitride (GaN) FET in a TO-247 package  
12 January 2021  
Product data sheet  
1. General description  
The GAN041-650WSB is a 650 V, 35 mΩ Gallium Nitride (GaN) FET in a TO-247 package. It is a  
normally-off device that combines Nexperia’s latest high-voltage GaN HEMT H2 technology and  
low-voltage silicon MOSFET technologies — offering superior reliability and performance.  
2. Features and benefits  
Ultra-low reverse recovery charge  
Simple gate drive (0 V to +10 V or 12 V)  
Robust gate oxide (±20 V capability)  
High gate threshold voltage (+4 V) for very good gate bounce immunity  
Very low source-drain voltage in reverse conduction mode  
Transient over-voltage capability  
3. Applications  
Hard and soft switching converters for industrial and datacom power  
Bridgeless totempole PFC  
PV and UPS inverters  
Servo motor drives  
4. Quick reference data  
Table 1. Quick reference data  
Symbol  
VDS  
ID  
Parameter  
Conditions  
Min  
Typ  
Max  
650  
47.2  
187  
175  
Unit  
V
drain-source voltage  
drain current  
-55 °C ≤ Tj ≤ 175 °C  
VGS = 10 V; Tmb = 25 °C; Fig. 2  
-
-
-
-
-
-
A
Ptot  
total power dissipation Tmb = 25 °C; Fig. 1  
junction temperature  
-
W
Tj  
-55  
°C  
Static characteristics  
RDSon drain-source on-state  
resistance  
Dynamic characteristics  
VGS = 10 V; ID = 32 A; Tj = 25 °C;  
Fig. 11  
-
35  
41  
mΩ  
QGD  
gate-drain charge  
total gate charge  
ID = 32 A; VDS = 400 V; VGS = 10 V;  
Tj = 25 °C; Fig. 13; Fig. 14  
-
-
6.6  
22  
-
-
nC  
nC  
QG(tot)  
Source-drain diode  
Qr recovered charge  
IS = 32 A; dIS/dt = -1000 A/µs;  
VGS = 0 V; VDS = 400 V; Fig. 20  
-
150  
-
nC  
 
 
 
 

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