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GAN3R2-100CBE PDF预览

GAN3R2-100CBE

更新时间: 2024-11-14 11:15:31
品牌 Logo 应用领域
安世 - NEXPERIA /
页数 文件大小 规格书
13页 294K
描述
100 V, 3.2 mOhm Gallium Nitride (GaN) FET in a 3.5 mm x 2.13 mm Wafer Level Chip-Scale Package (WLCSP)Production

GAN3R2-100CBE 数据手册

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GAN3R2-100CBE  
8
P
S
C
L
W
100 V, 3.2 mOhm Gallium Nitride (GaN) FET in a  
3.5 mm x 2.13 mm Wafer Level Chip-Scale Package (WLCSP)  
27 April 2023  
Product data sheet  
1. General description  
The GAN3R2-100CBE is a a general purpose 100 V, 3.2 mΩ Gallium Nitride (GaN) FET in a 15  
bump Wafer Level Chip-Scale Package (WLCSP). It is a normally-off e-mode device offering  
superior performance.  
2. Features and benefits  
Enhancement mode - normally-off power switch  
Ultra high frequency switching capability  
No body diode  
Low gate charge, low output charge  
Qualified for standard applications  
ESD protection  
RoHS, Pb-free, REACH-compliant  
High efficiency and high power density  
Wafer Level Chip-Scale Package (WLCSP) 3.5 mm x 2.13 mm  
3. Applications  
High power density and high efficiency power conversion  
AC-to-DC converters, (secondary stage)  
High frequency DC-to-DC converters in 48 V systems  
Fast battery charging, mobile phone, laptop, tablet and USB type-C chargers  
Datacom and telecom (AC-to-DC and DC-to-DC) converters  
Motor drives  
LiDAR (non-automotive)  
Class D audio amplifiers  
4. Quick reference data  
Table 1. Quick reference data  
Symbol  
VDS  
Parameter  
Conditions  
Min  
Typ  
Max  
100  
130  
Unit  
V
drain-source voltage  
-
-
-
-
VTDS  
transient drain to  
source voltage  
pulsed; tp = 1 µs; δfactor = 0.01  
VGS = 5 V  
V
ID  
drain current  
[1]  
-
-
-
-
60  
A
Ptot  
Tj  
total power dissipation Fig. 1  
junction temperature  
-
394  
150  
W
°C  
-40  
Static characteristics  
RDSon drain-source on-state  
VGS = 5 V; ID = 25 A; Tj = 25 °C; Fig. 9;  
Fig. 10; Fig. 11; Fig. 12  
-
-
2.4  
2.2  
3.2  
-
mΩ  
Ω
resistance  
RG  
gate resistance  
f = 5 MHz; Tj = 25 °C  
 
 
 
 

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