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CY7C25422KV18-333BZXC PDF预览

CY7C25422KV18-333BZXC

更新时间: 2024-02-20 23:38:10
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器内存集成电路
页数 文件大小 规格书
28页 569K
描述
QDR SRAM, 4MX18, CMOS, PBGA165, FBGA-165

CY7C25422KV18-333BZXC 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:LBGA,Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
Factory Lead Time:1 week风险等级:5.78
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
JESD-30 代码:R-PBGA-B165长度:15 mm
内存密度:75497472 bit内存集成电路类型:QDR SRAM
内存宽度:18功能数量:1
端子数量:165字数:4194304 words
字数代码:4000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:4MX18封装主体材料:PLASTIC/EPOXY
封装代码:LBGA封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED座面最大高度:1.4 mm
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:13 mmBase Number Matches:1

CY7C25422KV18-333BZXC 数据手册

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CY7C25422KV18  
®
72-Mbit QDR II+ SRAM Two-Word  
Burst Architecture (2.0 Cycle Read Latency)with ODT  
72-Mbit QDR® II+ SRAM Two-Word Burst Architecture (2.0 Cycle Read Latency) with ODT  
JTAG 1149.1 compatible test access port  
Features  
Phase Locked Loop (PLL) for accurate data placement  
Separate independent read and write data ports  
Supports concurrent transactions  
Configurations  
333 MHz clock for high bandwidth  
With Read Cycle Latency of 2.0 cycles:  
Two-word burst for reducing address bus frequency  
CY7C25422KV18 – 4M × 18  
DoubleDataRate(DDR)interfacesonbothreadandwriteports  
(data transferred at 666 MHz) at 333 MHz  
Functional Description  
The CY7C25422KV18 are 1.8 V Synchronous Pipelined  
SRAMs, equipped with QDR® II+ architecture. Similar to QDR II  
architecture, QDR II+ architecture consists of two separate ports:  
the read port and the write port to access the memory array. The  
read port has dedicated data outputs to support read operations  
and the write port has dedicated data inputs to support write  
operations. QDR II+ architecture has separate data inputs and  
data outputs to completely eliminate the need to “turnaround” the  
data bus that exists with common devices. Access to each port  
is through a common address bus. Addresses for read and write  
addresses are latched on alternate rising edges of the input (K)  
clock. Accesses to the QDR II+ read and write ports are  
completely independent of one another. To maximize data  
throughput, both read and write ports are equipped with DDR  
interfaces. Each address location is associated with two 18-bit  
words (CY7C25422KV18) that burst sequentially into or out of  
the device. Because data can be transferred into and out of the  
device on every rising edge of both input clocks (K and K),  
memory bandwidth is maximized while simplifying system  
design by eliminating bus “turnarounds”.  
Available in 2.0 clock cycle latency  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Echo clocks (CQ and CQ) simplify data capture in high speed  
systems  
Data valid pin (QVLD) to indicate valid data on the output  
On-Die Termination (ODT) feature  
Supported for D[x:0], BWS[x:0], and K/K inputs  
Single multiplexed address input bus latches address inputs  
for both read and write ports  
Separate port selects for depth expansion  
Synchronous internally self-timed writes  
QDR® II+ operates with 2.0 cycle read latency when DOFF is  
asserted HIGH  
OperatessimilartoQDRIdevicewith1cyclereadlatencywhen  
DOFF is asserted LOW  
These devices have an On-Die Termination feature supported  
for D[x:0], BWS[x:0], and K/K inputs, which helps eliminate  
external termination resistors, reduce cost, reduce board area,  
and simplify board routing.  
Available in × 18 configurations  
Full data coherency, providing most current data  
Depth expansion is accomplished with port selects, which  
enables each port to operate independently.  
[1]  
Core VDD = 1.8 V± 0.1 V; VDDQ = 1.4 V to VDD  
Supports both 1.5 V and 1.8 V supply  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the K or K input clocks. Writes are  
conducted with on-chip synchronous self-timed write circuitry.  
HSTL inputs and variable drive HSTL output buffers  
Available in 165-Ball FBGA package (13 × 15 × 1.4 mm)  
Offered in Pb-free packages  
For a complete list of related documentation, click here.  
Selection Guide  
Description  
Maximum Operating Frequency  
333 MHz Unit  
333  
810  
MHz  
mA  
Maximum Operating Current  
× 18  
Note  
1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support V  
= 1.4V to V  
.
DD  
DDQ  
Cypress Semiconductor Corporation  
Document Number: 001-90368 Rev. *D  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised January 3, 2018  
 
 

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