CY7C25422KV18
®
72-Mbit QDR II+ SRAM Two-Word
Burst Architecture (2.0 Cycle Read Latency)with ODT
72-Mbit QDR® II+ SRAM Two-Word Burst Architecture (2.0 Cycle Read Latency) with ODT
■ JTAG 1149.1 compatible test access port
Features
■ Phase Locked Loop (PLL) for accurate data placement
■ Separate independent read and write data ports
❐ Supports concurrent transactions
Configurations
■ 333 MHz clock for high bandwidth
With Read Cycle Latency of 2.0 cycles:
■ Two-word burst for reducing address bus frequency
CY7C25422KV18 – 4M × 18
■ DoubleDataRate(DDR)interfacesonbothreadandwriteports
(data transferred at 666 MHz) at 333 MHz
Functional Description
The CY7C25422KV18 are 1.8 V Synchronous Pipelined
SRAMs, equipped with QDR® II+ architecture. Similar to QDR II
architecture, QDR II+ architecture consists of two separate ports:
the read port and the write port to access the memory array. The
read port has dedicated data outputs to support read operations
and the write port has dedicated data inputs to support write
operations. QDR II+ architecture has separate data inputs and
data outputs to completely eliminate the need to “turnaround” the
data bus that exists with common devices. Access to each port
is through a common address bus. Addresses for read and write
addresses are latched on alternate rising edges of the input (K)
clock. Accesses to the QDR II+ read and write ports are
completely independent of one another. To maximize data
throughput, both read and write ports are equipped with DDR
interfaces. Each address location is associated with two 18-bit
words (CY7C25422KV18) that burst sequentially into or out of
the device. Because data can be transferred into and out of the
device on every rising edge of both input clocks (K and K),
memory bandwidth is maximized while simplifying system
design by eliminating bus “turnarounds”.
■ Available in 2.0 clock cycle latency
■ Two input clocks (K and K) for precise DDR timing
❐ SRAM uses rising edges only
■ Echo clocks (CQ and CQ) simplify data capture in high speed
systems
■ Data valid pin (QVLD) to indicate valid data on the output
■ On-Die Termination (ODT) feature
❐ Supported for D[x:0], BWS[x:0], and K/K inputs
■ Single multiplexed address input bus latches address inputs
for both read and write ports
■ Separate port selects for depth expansion
■ Synchronous internally self-timed writes
■ QDR® II+ operates with 2.0 cycle read latency when DOFF is
asserted HIGH
■ OperatessimilartoQDRIdevicewith1cyclereadlatencywhen
DOFF is asserted LOW
These devices have an On-Die Termination feature supported
for D[x:0], BWS[x:0], and K/K inputs, which helps eliminate
external termination resistors, reduce cost, reduce board area,
and simplify board routing.
■ Available in × 18 configurations
■ Full data coherency, providing most current data
Depth expansion is accomplished with port selects, which
enables each port to operate independently.
[1]
■ Core VDD = 1.8 V± 0.1 V; VDDQ = 1.4 V to VDD
❐ Supports both 1.5 V and 1.8 V supply
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the K or K input clocks. Writes are
conducted with on-chip synchronous self-timed write circuitry.
■ HSTL inputs and variable drive HSTL output buffers
■ Available in 165-Ball FBGA package (13 × 15 × 1.4 mm)
■ Offered in Pb-free packages
For a complete list of related documentation, click here.
Selection Guide
Description
Maximum Operating Frequency
333 MHz Unit
333
810
MHz
mA
Maximum Operating Current
× 18
Note
1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support V
= 1.4V to V
.
DD
DDQ
Cypress Semiconductor Corporation
Document Number: 001-90368 Rev. *D
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised January 3, 2018