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CY14C101J2-SXIT PDF预览

CY14C101J2-SXIT

更新时间: 2024-11-24 12:20:07
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 存储内存集成电路静态存储器光电二极管
页数 文件大小 规格书
32页 1995K
描述
1 Mbit (128 K × 8) Serial (I2C) nvSRAM

CY14C101J2-SXIT 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Active零件包装代码:SOIC
包装说明:SOP, SOP8,.25针数:8
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.74
Is Samacsys:NJESD-30 代码:R-PDSO-G8
JESD-609代码:e4长度:4.889 mm
内存密度:1048576 bit内存集成电路类型:NON-VOLATILE SRAM
内存宽度:8湿度敏感等级:3
功能数量:1端子数量:8
字数:131072 words字数代码:128000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:128KX8
封装主体材料:PLASTIC/EPOXY封装代码:SOP
封装等效代码:SOP8,.25封装形状:RECTANGULAR
封装形式:SMALL OUTLINE并行/串行:SERIAL
峰值回流温度(摄氏度):260电源:2.5 V
认证状态:Not Qualified座面最大高度:1.727 mm
最大待机电流:0.00015 A子类别:SRAMs
最大压摆率:0.003 mA最大供电电压 (Vsup):2.6 V
最小供电电压 (Vsup):2.4 V标称供电电压 (Vsup):2.5 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:30
宽度:3.8985 mmBase Number Matches:1

CY14C101J2-SXIT 数据手册

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CY14C101J  
PRELIMINARY  
CY14B101J, CY14E101J  
1 Mbit (128 K × 8) Serial (I2C) nvSRAM  
Industry standard configurations  
Operating voltages:  
• CY14C101J: VCC = 2.4 V to 2.6 V  
• CY14B101J: VCC = 2.7 V to 3.6 V  
• CY14E101J: VCC = 4.5 V to 5.5 V  
Industrial temperature  
Features  
1-Mbit nonvolatile static random access memory (nvSRAM)  
Internally organized as 128 K × 8  
STORE to QuantumTrap nonvolatile elements initiated  
automatically on power-down (AutoStore) or by using I2C  
command (SoftwareSTORE) orHSBpin(HardwareSTORE)  
8- and 16-pin small outline integrated circuit (SOIC) package  
Restriction of hazardous substances (RoHS) compliant  
RECALL to SRAM initiated on power-up (Power-Up RE-  
CALL) or by I2C command (Software RECALL)  
Automatic STORE on power-down with a small capacitor (ex-  
cept for CY14X101J1)  
Overview  
The Cypress CY14C101J/CY14B101J/CY14E101J combines a  
1-Mbit nvSRAM[1] with a nonvolatile element in each memory  
cell. The memory is organized as 128 K words of 8 bits each. The  
embedded nonvolatile elements incorporate the QuantumTrap  
technology, creating the world’s most reliable nonvolatile  
memory. The SRAM provides infinite read and write cycles, while  
the QuantumTrap cells provide highly reliable nonvolatile  
storage of data. Data transfers from SRAM to the nonvolatile  
elements (STORE operation) takes place automatically at  
power-down (except for CY14X101J1). On power-up, data is  
restored to the SRAM from the nonvolatile memory (RECALL  
operation). The STORE and RECALL operations can also be  
initiated by the user through I2C commands.  
High reliability  
Infinite read, write, and RECALL cycles  
1 million STORE cycles to QuantumTrap  
Data retention: 20 years at 85 °C  
High speed I2C interface  
Industry standard 100 kHz and 400 kHz speed  
Fast-mode Plus: 1 MHz speed  
High speed: 3.4 MHz  
Zero cycle delay reads and writes  
Write protection  
Hardware protection using Write Protect (WP) pin  
Software block protection for 1/4, 1/2, or entire array  
I2C access to special functions  
Nonvolatile STORE/RECALL  
8 byte serial number  
Configuration  
Feature  
CY14X101J1  
CY14X101J2  
CY14X101J3  
AutoStore  
No  
Yes  
Yes  
Yes  
Yes  
Manufacturer ID and Product ID  
Sleep mode  
Software  
STORE  
Yes  
Low power consumption  
Hardware  
STORE  
No  
No  
Yes  
Average active current of 1 mA at 3.4 MHz operation  
Average standby mode current of 150 uA  
Sleep mode current of 8 uA  
Logic Block Diagram  
Serial Number  
8 x 8  
VCC VCAP  
Manufacture ID/  
Product ID  
Power Control  
Block  
Memory Control Register  
Command Register  
Quantrum Trap  
128 K x 8  
Sleep  
STORE  
SRAM  
128 K x 8  
Control Registers Slave  
Memory Slave  
SDA  
SCL  
A2, A1  
WP  
I2C Control Logic  
Slave Address  
Decoder  
Memory  
Address and Data  
Control  
RECALL  
Note  
2
1. Serial (I C) nvSRAM is referred to as nvSRAM throughout the datasheet.  
Cypress Semiconductor Corporation  
Document #: 001-54050 Rev. *D  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised January 19, 2011  
[+] Feedback  

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