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854S01AKILF PDF预览

854S01AKILF

更新时间: 2024-02-27 19:20:17
品牌 Logo 应用领域
艾迪悌 - IDT 逻辑集成电路
页数 文件大小 规格书
17页 300K
描述
2:1 Differential-to-LVDS Multiplexer

854S01AKILF 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:VFQFPN
包装说明:HVQCCN, LCC16,.12SQ,20针数:16
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:1.27
系列:854JESD-30 代码:S-XQCC-N16
JESD-609代码:e3长度:3 mm
逻辑集成电路类型:MULTIPLEXER湿度敏感等级:3
功能数量:1输入次数:2
输出次数:1端子数量:16
最高工作温度:85 °C最低工作温度:-40 °C
输出极性:INVERTED封装主体材料:UNSPECIFIED
封装代码:HVQCCN封装等效代码:LCC16,.12SQ,20
封装形状:SQUARE封装形式:CHIP CARRIER, HEAT SINK/SLUG, VERY THIN PROFILE
峰值回流温度(摄氏度):260电源:3.3 V
Prop。Delay @ Nom-Sup:0.6 ns传播延迟(tpd):0.6 ns
认证状态:Not Qualified座面最大高度:1 mm
子类别:Clock Drivers最大供电电压 (Vsup):3.465 V
最小供电电压 (Vsup):3.135 V标称供电电压 (Vsup):3.3 V
表面贴装:YES温度等级:INDUSTRIAL
端子面层:Matte Tin (Sn) - annealed端子形式:NO LEAD
端子节距:0.5 mm端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:3 mm
Base Number Matches:1

854S01AKILF 数据手册

 浏览型号854S01AKILF的Datasheet PDF文件第8页浏览型号854S01AKILF的Datasheet PDF文件第9页浏览型号854S01AKILF的Datasheet PDF文件第10页浏览型号854S01AKILF的Datasheet PDF文件第12页浏览型号854S01AKILF的Datasheet PDF文件第13页浏览型号854S01AKILF的Datasheet PDF文件第14页 
ICS854S01I Datasheet  
2:1 DIFFERENTIAL-TO-LVDS MULTIPLEXER  
VFQFN EPAD Thermal Release Path  
In order to maximize both the removal of heat from the package and  
the electrical performance, a land pattern must be incorporated on  
the Printed Circuit Board (PCB) within the footprint of the package  
corresponding to the exposed metal pad or exposed heat slug on the  
package, as shown in Figure 4. The solderable area on the PCB, as  
defined by the solder mask, should be at least the same size/shape  
as the exposed pad/slug area on the package to maximize the  
thermal/electrical performance. Sufficient clearance should be  
designed on the PCB between the outer edges of the land pattern  
and the inner edges of pad pattern for the leads to avoid any shorts.  
and dependent upon the package power dissipation as well as  
electrical conductivity requirements. Thus, thermal and electrical  
analysis and/or testing are recommended to determine the minimum  
number needed. Maximum thermal and electrical performance is  
achieved when an array of vias is incorporated in the land pattern. It  
is recommended to use as many vias connected to ground as  
possible. It is also recommended that the via diameter should be 12  
to 13mils (0.30 to 0.33mm) with 1oz copper via barrel plating. This is  
desirable to avoid any solder wicking inside the via during the  
soldering process which may result in voids in solder between the  
exposed pad/slug and the thermal land. Precautions should be taken  
to eliminate any solder voids between the exposed heat slug and the  
land pattern. Note: These recommendations are to be used as a  
guideline only. For further information, please refer to the Application  
Note on the Surface Mount Assembly of Amkor’s Thermally/  
Electrically Enhance Leadframe Base Package, Amkor Technology.  
While the land pattern on the PCB provides a means of heat transfer  
and electrical grounding from the package to the board through a  
solder joint, thermal vias are necessary to effectively conduct from  
the surface of the PCB to the ground plane(s). The land pattern must  
be connected to ground through these vias. The vias act as “heat  
pipes”. The number of vias (i.e. “heat pipes”) are application specific  
SOLDER  
SOLDER  
PIN  
PIN  
EXPOSED HEAT SLUG  
PIN PAD  
GROUND PLANE  
LAND PATTERN  
(GROUND PAD)  
PIN PAD  
THERMAL VIA  
Figure 4. P.C. Assembly for Exposed Pad Thermal Release Path – Side View (drawing not to scale)  
ICS854S01AKI June 15, 2017  
11  
©2017 Integrated Device Technology, Inc.  

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