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74HC373BQ-Q100 PDF预览

74HC373BQ-Q100

更新时间: 2024-11-29 11:10:27
品牌 Logo 应用领域
安世 - NEXPERIA /
页数 文件大小 规格书
16页 272K
描述
Octal D-type transparent latch; 3-stateProduction

74HC373BQ-Q100 数据手册

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74HC373-Q100; 74HCT373-Q100  
Octal D-type transparent latch; 3-state  
Rev. 2 — 22 July 2020  
Product data sheet  
1. General description  
The 74HC373-Q100; 74HCT373-Q100 is an octal D-type transparent latch with 3-state outputs.  
The device features latch enable (LE) and output enable (OE) inputs. When LE is HIGH, data at  
the inputs enter the latches. In this condition the latches are transparent, a latch output will change  
each time its corresponding D-input changes. When LE is LOW the latches store the information  
that was present at the inputs a set-up time preceding the HIGH-to-LOW transition of LE. A HIGH  
on OE causes the outputs to assume a high-impedance OFF-state. Operation of the OE input does  
not affect the state of the latches. Inputs include clamp diodes. This enables the use of current  
limiting resistors to interface inputs to voltages in excess of VCC  
.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100  
(Grade 1) and is suitable for use in automotive applications.  
2. Features and benefits  
Automotive product qualification in accordance with AEC-Q100 (Grade 1)  
Specified from -40 °C to +85 °C and from -40 °C to +125 °C  
Wide supply voltage range from 2.0 V to 6.0 V  
CMOS low power dissipation  
High noise immunity  
Latch-up performance exceeds 100 mA per JESD 78 Class II Level B  
Complies with JEDEC standards:  
JESD8C (2.7 V to 3.6 V)  
JESD7A (2.0 V to 6.0 V)  
Input levels:  
For 74HC373-Q100: CMOS level  
For 74HCT373-Q100: TTL level  
3-state non-inverting outputs for bus-oriented applications  
Common 3-state output enable input  
ESD protection:  
MIL-STD-883, method 3015 exceeds 2000 V  
HBM JESD22-A114F exceeds 2000 V  
MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)  
Multiple package options  
DHVQFN package with Side-Wettable Flanks enabling Automatic Optical Inspection (AOI) of  
solder joints  
 
 

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