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2SK1860 PDF预览

2SK1860

更新时间: 2024-11-17 22:52:51
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松下 - PANASONIC /
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描述
Silicon N-Channel Junction FET

2SK1860 数据手册

 浏览型号2SK1860的Datasheet PDF文件第2页浏览型号2SK1860的Datasheet PDF文件第3页 
Silicon Junction FETs (Small Signal)  
2SK1860  
Silicon N-Channel Junction FET  
Unit: mm  
For impedance conversion in low frequency  
For electret capacitor microphone  
0.40 +00..0150  
0.12 +00..0012  
3
Features  
High mutual conductance gm  
Low noise voltage of NV  
1
2
Absolute Maximum Ratings Ta = 25°C  
(0.95) (0.95)  
1.9 0.1  
(0.5)  
2.9 0.2  
Parameter  
Symbol  
VDSO  
VDGO  
IDSO  
IDGO  
IGSO  
PD  
Rating  
Unit  
V
10˚  
Drain-source voltage (Gate open)  
Drain-gate voltage (Souse open)  
Drain-source current (Gate open)  
Drain-gate current (Souse open)  
Gate-source cutoff current (Drain open)  
Power dissipation  
20  
20  
V
2
mA  
mA  
mA  
mW  
°C  
1: Drain  
2: Source  
3: Gate  
2
2
Minit3-F1 Package  
200  
Marking Symbol: 1H  
Operating ambient temperature  
Storage temperature  
Topr  
20 to +80  
55 to +150  
Tstg  
°C  
Electrical Characteristics Ta = 25°C 3°C  
Parameter  
Drain current  
Symbol  
ID  
Conditions  
Min  
Typ Max Unit  
VDS = 4.5 V, CO = 10 pFRD = 2.2 kΩ  
VDS = 4.5 V, VGS = 0  
100  
95  
600  
480  
µA  
µA  
1%  
Drain-sourse cutoff current  
(G-S short)  
IDSS  
Mutual conductance  
Noise voltage  
gm  
VD = 4.5 V, VGS = 0f = 1 kHz  
700 1600  
µS  
NV  
VD = 4.5 V, RD = 2.2 k1%  
CO = 10 pF, A-curve  
4
µV  
Voltage gain  
Gv1  
Gv2  
Gv3  
VD = 4.5 V, RD = 2.2 k1%  
CO = 10 pF, eG = 10 mVf = 1 kHz  
3  
2
dB  
dB  
dB  
VD = 12 V, RD = 2.2 k1%  
CO = 10 pF, eG = 10 mVf = 1 kHz  
0
3.3  
VD = 1.5 V, RD = 2.2 k1%  
4.5 0.3  
CO = 10 pF, eG = 10 mVf = 1 kHz  
∆Gv · f*  
VD = 4.5 V, RD = 2.2 k1%  
0
1.5  
dB  
CO = 10 pF, eG = 10 mVf = 1 kHz to 70 Hz  
Voltage gain difference  
∆Gv2 Gv1  
∆Gv1 Gv3  
0
0
3.5  
3.5  
dB  
dB  
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.  
2. : ∆Gv · fis assured for AQL0.065%. (the measurment method is used by source-grounded circuit.)  
*
Publication date: August 2003  
SJF00039AED  
1

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