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2SC4207YTE85R PDF预览

2SC4207YTE85R

更新时间: 2024-11-24 15:25:51
品牌 Logo 应用领域
东芝 - TOSHIBA 放大器光电二极管晶体管
页数 文件大小 规格书
4页 237K
描述
TRANSISTOR 150 mA, 50 V, 2 CHANNEL, NPN, Si, SMALL SIGNAL TRANSISTOR, BIP General Purpose Small Signal

2SC4207YTE85R 技术参数

生命周期:Active包装说明:SMALL OUTLINE, R-PDSO-G5
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.21.00.95风险等级:5.69
最大集电极电流 (IC):0.15 A基于收集器的最大容量:3.5 pF
集电极-发射极最大电压:50 V配置:COMMON EMITTER, 2 ELEMENTS
最小直流电流增益 (hFE):120JESD-30 代码:R-PDSO-G5
元件数量:2端子数量:5
最高工作温度:125 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:DUAL晶体管应用:AMPLIFIER
晶体管元件材料:SILICON标称过渡频率 (fT):80 MHz
VCEsat-Max:0.25 VBase Number Matches:1

2SC4207YTE85R 数据手册

 浏览型号2SC4207YTE85R的Datasheet PDF文件第2页浏览型号2SC4207YTE85R的Datasheet PDF文件第3页浏览型号2SC4207YTE85R的Datasheet PDF文件第4页 
2SC4207  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process)  
2SC4207  
Audio Frequency General Purpose Amplifier Applications  
Unit: mm  
Small package (dual type)  
High voltage and high current: V  
= 50 V, I = 150 mA (max)  
CEO  
C
High h  
h
= 120~700  
linearity: h  
FE: FE  
Excellent h  
(I = 0.1 mA)/h  
C
(I = 2 mA) = 0.95 (typ.)  
FE C  
FE  
FE  
Complementary to 2SA1618  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
60  
50  
5
V
V
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
V
I
150  
30  
mA  
mA  
C
Base current  
I
B
P
C
JEDEC  
JEITA  
Collector power dissipation  
300  
mW  
(Note 1)  
Junction temperature  
T
125  
°C  
°C  
j
TOSHIBA  
2-3L1A  
Storage temperature range  
T
stg  
55~125  
Weight: 0.014 g (typ.)  
Note:  
Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to  
decrease in the reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
Marking  
Equivalent Circuit (top view)  
1
2007-11-01  

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