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2SA1298-Y(TE85L,F) PDF预览

2SA1298-Y(TE85L,F)

更新时间: 2024-11-24 14:47:07
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
4页 184K
描述
TRANSISTOR 800 mA, 25 V, PNP, Si, SMALL SIGNAL TRANSISTOR, 2-3F1A, S-MINI, SC-59, TO-236MOD, 3 PIN, BIP General Purpose Small Signal

2SA1298-Y(TE85L,F) 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Active零件包装代码:SOT-23
包装说明:SMALL OUTLINE, R-PDSO-G3针数:3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.21.00.75风险等级:1.69
Is Samacsys:N最大集电极电流 (IC):0.8 A
集电极-发射极最大电压:25 V配置:SINGLE
最小直流电流增益 (hFE):160JEDEC-95代码:TO-236
JESD-30 代码:R-PDSO-G3元件数量:1
端子数量:3最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:PNP功耗环境最大值:0.2 W
最大功率耗散 (Abs):0.2 W表面贴装:YES
端子形式:GULL WING端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):120 MHz
VCEsat-Max:0.4 VBase Number Matches:1

2SA1298-Y(TE85L,F) 数据手册

 浏览型号2SA1298-Y(TE85L,F)的Datasheet PDF文件第2页浏览型号2SA1298-Y(TE85L,F)的Datasheet PDF文件第3页浏览型号2SA1298-Y(TE85L,F)的Datasheet PDF文件第4页 
2SA1298  
TOSHIBA Transistor Silicon PNP Epitaxial (PCT process)  
2SA1298  
Low Frequency Power Amplifier Application  
Unit: mm  
Power Switching Applications  
High DC current gain: h  
= 100 to 320  
FE  
Low saturation voltage: V  
= 0.4 V (max)  
CE (sat)  
(I = 500 mA, I = 20 mA)  
C
Suitable for driver stage of small motor  
Complementary to 2SC3265  
Small package  
B
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
30  
25  
V
V
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
5  
V
I
800  
160  
200  
mA  
mA  
mW  
°C  
°C  
C
JEDEC  
JEITA  
TO-236MOD  
Base current  
I
B
SC-59  
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
TOSHIBA  
2-3F1A  
T
j
150  
Weight: 0.012 g (typ.)  
T
stg  
55 to 150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Marking  
Start of commercial production  
1982-10  
1
2014-03-01  

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