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UPD4482162GF-C60-A PDF预览

UPD4482162GF-C60-A

更新时间: 2024-11-18 13:15:11
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日电电子 - NEC 存储内存集成电路静态存储器
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UPD4482162GF-C60-A 数据手册

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DATA SHEET  
MOS INTEGRATED CIRCUIT  
µ
PD4482162, 4482182, 4482322, 4482362  
8M-BIT CMOS SYNCHRONOUS FAST SRAM  
PIPELINED OPERATION  
SINGLE CYCLE DESELECT  
Description  
The µPD4482162 is a 524,288-word by 16-bit, the µPD4482182 is a 524,288-word by 18-bit, µPD4482322 is a 262,144-  
word by 32-bit and the µPD4482362 is a 262,144-word by 36-bit synchronous static RAM fabricated with advanced CMOS  
technology using Full-CMOS six-transistor memory cell.  
The µPD4482162, µPD4482182, µPD4482322 and µPD4482362 integrates unique synchronous peripheral circuitry, 2-  
bit burst counter and output buffer as well as SRAM core. All input registers are controlled by a positive edge of the single  
clock input (CLK).  
The µPD4482162, µPD4482182, µPD4482322 and µPD4482362 are suitable for applications which require synchronous  
operation, high speed, low voltage, high density and wide bit configuration, such as cache and buffer memory.  
ZZ has to be set LOW at the normal operation. When ZZ is set HIGH, the SRAM enters Power Down State (“Sleep”). In  
the “Sleep” state, the SRAM internal state is preserved. When ZZ is set LOW again, the SRAM resumes normal operation.  
The µPD4482162, µPD4482182, µPD4482322 and µPD4482362 are packaged in 100-pin PLASTIC LQFP with a 1.4  
mm package thickness for high density and low capacitive loading.  
Features  
3.3 V or 2.5 V core supply  
Synchronous operation  
Operating temperature : TA = 0 to 70 °C (-A44, -A50, -A60, -C60)  
TA = 40 to +85 °C (-A44Y, -A50Y, -A60Y, -C60Y)  
Internally self-timed write control  
Burst read / write : Interleaved burst and linear burst sequence  
Fully registered inputs and outputs for pipelined operation  
Single-Cycle deselect timing  
All registers triggered off positive clock edge  
3.3 V or 2.5 V LVTTL Compatible : All inputs and outputs  
Fast clock access time : 2.8 ns (225 MHz), 3.1 ns (200 MHz), 3.5 ns (167 MHz)  
Asynchronous output enable : /G  
Burst sequence selectable : MODE  
Sleep mode : ZZ (ZZ = Open or Low : Normal operation)  
Separate byte write enable : /BW1 to /BW4, /BWE (µPD4482322, µPD4482362)  
/BW1, /BW2, /BWE (µPD4482162, µPD4482182)  
Global write enable : /GW  
Three chip enables for easy depth expansion  
Common I/O using three state outputs  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all products and/or types are available in every country. Please check with an NEC Electronics  
sales representative for availability and additional information.  
Document No. M14522EJ3V0DS00 (3rd edition)  
Date Published December 2002 NS CP(K)  
Printed in Japan  
The mark  shows major revised points.  
2000  

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