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TND307/D PDF预览

TND307/D

更新时间: 2024-09-12 23:36:55
品牌 Logo 应用领域
其他 - ETC 测试
页数 文件大小 规格书
8页 79K
描述
Graphical Data Test Circuits for the NCP1650

TND307/D 数据手册

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TND307  
Graphical Data Test  
Circuits for the NCP1650  
Prepared by  
Alan Ball  
ON Semiconductor Applications Engineering  
http://onsemi.com  
The following circuits are the test configurations that  
were used to obtain the data for the graphical section of the  
NCP1650/D data sheet. Each graph has a schematic  
associated with it and in some cases a description of the  
procedure.  
APPLICATION NOTE  
14 V  
14 V  
1 mF  
30 k  
30 k  
0.1 mF  
0.1 mF  
1
2
1
2
1 mF  
V
V
V
V
in  
ref  
in  
ref  
3
4
5
6
7
8
9
3
4
5
6
7
8
9
AC Comp  
Ref Filter  
AC Input  
FB/SD  
AC Comp  
Ref Filter  
AC Input  
FB/SD  
16  
12  
16  
12  
Output  
Output  
300  
0 to –5 V  
0.5 mF  
I
S–  
0.05 mF  
0–5 V  
I
S–  
10  
11  
10  
11  
I
I
avg  
avg  
Loop Comp  
Loop Comp  
0–5 V  
I
I
avg fltr  
avg fltr  
1 nF  
P
comp  
P
max  
P
comp  
P
max  
0–5 V  
1 k  
Ramp  
Comp  
Ramp  
Comp  
0.1 mF  
GND  
C
GND  
C
T
T
10  
15 k  
15  
14  
13  
47 k  
15  
14  
13  
47 k  
10 k  
10 k  
47 k  
470 pF  
470 pF  
Figure 1. Power Multiplier Family of Curves  
Figure 2. Reference Multiplier Family of Curves  
Re: NCP1650/D data sheet, Figure 3  
Re: NCP1650/D data sheet, Figure 4  
Power up chip. Set I between 0 and –200 mV in 50 mV  
S–  
increments. For each value of I set the ac input (pin 5) to  
S–  
various values from 0 to 3.8 volts. Record output P  
(pin 9).  
max  
Semiconductor Components Industries, LLC, 2002  
1
Publication Order Number:  
March, 2002 – Rev.0  
TND307/D  

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