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TND308/D PDF预览

TND308/D

更新时间: 2024-10-29 23:36:55
品牌 Logo 应用领域
其他 - ETC 测试
页数 文件大小 规格书
8页 69K
描述
Graphical Data Test Circuits for the NCP1651

TND308/D 数据手册

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TND308  
Graphical Data Test  
Circuits for the NCP1651  
Prepared by  
Alan Ball  
ON Semiconductor Applications Engineering  
http://onsemi.com  
The following circuits are the test configurations that were  
used to obtain the data for the graphical section of the  
NCP1651/D data sheet. Each graph has a schematic  
associated with it and in some cases a description of the  
procedure.  
APPLICATION NOTE  
14 V  
14 V  
0.1 mF  
0.1 mF  
13  
12  
13  
12  
1 mF  
1 mF  
V
V
V
V
ref  
CC  
ref  
CC  
16  
16  
Startup  
Startup  
1
5
1
5
Output  
Output  
1 nF  
I
S+  
I
S+  
11  
8
8
+
AC Comp  
FB/SD  
FB/SD  
11  
0–1 V  
AC Comp  
7
6
7
6
I
I
avg  
avg  
I
I
avg fltr  
10  
9
10  
9
avg fltr  
0.5 nF  
Ref Fltr  
Ref Fltr  
R8  
1.5 V  
AC Input  
GND  
AC Input  
GND  
Ramp  
Comp  
Ramp  
Comp  
C
C
T
T
4.7 k  
2
3
4
2
3
4
470 pF  
470 pF  
47 k  
47 k  
Figure 1. Current Sense Amplifier Gain  
Figure 2. FB/SD V–I Characteristics  
Re: NCP1651/D data sheet, Figure 4  
Re: NCP1651/D data sheet, Figure 5  
Energize all three power sources, beginning with the 14 volt  
supply. Cycle the 14 volt supply down to 8 volts and back to  
14 to start unit operating. Adjust power supply on pin 5 and  
read voltages on pins 6 and 7.  
Using a decade resistance box for R8, set it to 1 MW. Turn  
on the 14 volt source. Cycle it down to 8 volts and back up to  
14 to turn the unit on. Read the voltage and pin 8 and note the  
resistance. Reduce R8 until the unit shuts down. Calculate the  
current for each reading.  
Semiconductor Components Industries, LLC, 2002  
1
Publication Order Number:  
May, 2002 – Rev.0  
TND308/D  

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