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TK40A10K3 PDF预览

TK40A10K3

更新时间: 2024-11-29 08:48:03
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体晶体管功率场效应晶体管开关脉冲局域网
页数 文件大小 规格书
6页 202K
描述
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOSⅣ)

TK40A10K3 技术参数

是否Rohs认证:符合生命周期:Not Recommended
零件包装代码:SC-67包装说明:FLANGE MOUNT, R-PSFM-T3
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.69
Is Samacsys:N雪崩能效等级(Eas):137 mJ
外壳连接:ISOLATED配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:100 V最大漏极电流 (Abs) (ID):40 A
最大漏极电流 (ID):40 A最大漏源导通电阻:0.015 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PSFM-T3
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:FLANGE MOUNT极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):40 W最大脉冲漏极电流 (IDM):160 A
认证状态:Not Qualified子类别:FET General Purpose Power
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:SINGLE晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

TK40A10K3 数据手册

 浏览型号TK40A10K3的Datasheet PDF文件第2页浏览型号TK40A10K3的Datasheet PDF文件第3页浏览型号TK40A10K3的Datasheet PDF文件第4页浏览型号TK40A10K3的Datasheet PDF文件第5页浏览型号TK40A10K3的Datasheet PDF文件第6页 
TK40A10K3  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS)  
TK40A10K3  
Switching Regulator Application  
Unit: mm  
Low drain-source ON resistance: R  
= 11.5 mΩ (typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 80 S  
fs  
Low leakage current: I  
= 10 μA (max) (V  
= 100 V)  
DSS  
DS  
Enhancement-mode: V = 2.0 to 4.0 V (V  
= 10 V, I = 1 mA)  
D
th  
DS  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
V
100  
±20  
40  
V
V
DSS  
Gate-source voltage  
GSS  
DC  
(Note 1)  
I
D
Drain current  
A
Pulse (Note 1)  
I
160  
40  
DP  
1: Gate  
2: Drain  
3: Source  
Drain power dissipation (Tc = 25°C)  
P
W
D
AS  
AR  
Single pulse avalanche energy  
E
137  
mJ  
(Note 2)  
Avalanche current  
I
40  
3.3  
A
JEDEC  
JEITA  
Repetitive avalanche energy (Note 3)  
Channel temperature  
E
mJ  
°C  
°C  
AR  
SC-67  
2-10U1B  
T
150  
ch  
TOSHIBA  
Weight: 1.7 g (typ.)  
Storage temperature range  
T
55 to 150  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability  
Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e.  
reliability test report and estimated failure rate, etc).  
Internal Connection  
Thermal Characteristics  
2
Characteristics  
Symbol  
Max  
Unit  
Thermal resistance, channel to case  
Thermal resistance, channel to ambient  
R
3.125  
62.5  
°C/W  
°C/W  
th (ch-c)  
R
th (ch-a)  
1
Note 1: Ensure that the channel & lead temperature does not exceed 150°C.  
Note 2: = 50 V, T = 25°C, L = 100 μH, I = 40 A, R = 1 Ω  
V
DD  
ch  
AR  
G
Note 3: Repetitive rating; pulse width limited by maximum channel temperature.  
This transistor is an electrostatic sensitive device. Handle with care.  
3
1
2009-09-29  

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