SSM6N951L
6. Electrical Characteristics
6.1. Static Characteristics (Unless otherwise specified, Ta = 25 �)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Gate-source leakage current
Source-source current (zero-gate voltage)
Source-source breakdown voltage
Gate threshold voltage
IGSS
ISSS
VSS = 0 V, VGS = ±8 V
ꢀ
ꢀ
ꢀ
ꢀ
±1
1
µA
VSS = 12 V, VGS = 0 V
V(BR)SSS IS = 1 mA, VGS = 0 V
Vth VSS = 10 V, IS = 0.84 mA
12
ꢀ
ꢀ
V
(Note 1)
0.35
3
0.9
4.4
4.6
4.9
5.5
0.7
1.4
5.1
5.5
6.8
10
1.2
Source–source on-resistance
(Note 2) RSS(ON) IS = 4 A, VGS = 4.5 V
IS = 4 A, VGS = 3.8 V
mΩ
3.2
3.5
3.8
ꢀ
IS = 4 A, VGS = 3.1 V
IS = 4 A, VGS = 2.5 V
Body diode forward voltage
(Note 2) VF(S-S) IF = 4 A, VGS = 0 V
V
Note 1: Let Vth be the voltage applied between gate and source that causes the source current (IS) to below (0.84 mA
for this device). Then, for normal switching operation, VGS(ON) must be higher than Vth, and VGS(OFF) must be
lower than Vth. This relationship can be expressed as: VGS(OFF) < Vth < VGS(ON).
Take this into consideration when using the device.
Note 2: Pulse measurement.
6.2. Dynamic Characteristics (Unless otherwise specified, Ta = 25 �)
Characteristics
Symbol
Test Condition
VDD = 6 V, IS = 3.0 A,
VGS = 0 to 4.0 V,
RG = 50 Ω, RL = 2 Ω
Duty ≤ 1 %, VIN: tr, tf < 5 ns
Common source, See Chapter 6.3
Min
Typ.
Max
Unit
Switching time (turn-on delay time)
Switching time (rise time)
td(on)
tr
ꢀ
ꢀ
ꢀ
ꢀ
1.1
1.4
4.5
3.0
ꢀ
ꢀ
ꢀ
ꢀ
µs
Switching time (turn-off delay time)
Switching time (fall time)
td(off)
tf
6.3. Switching Time Test Circuit
Fig. 6.3.1 Switching Time Test Circuit
Fig. 6.3.2 Input Waveform/Output Waveform
6.4. Gate Charge Characteristics (Unless otherwise specified, Ta = 25 �)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
nC
Total gate charge (gate-source plus gate-drain)
Gate-source charge 1
Qg
Qgs1
Qgd
VDD = 6 V, IS = 4.0 A, VGS = 4.0 V
VDD = 6 V, IS = 4.0 A
ꢀ
ꢀ
29
5
ꢀ
ꢀ
ꢀ
Gate-drain charge
7
©2019-2023
Toshiba Electronic Devices & Storage Corporation
2023-10-10
Rev.5.0
3