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SNJ54ACT8997FK

更新时间： 2024-09-08 22:25:35
品牌 Logo 应用领域
德州仪器 - TI 微控制器和处理器外围集成电路uCs集成电路uPs集成电路
页数 文件大小 规格书
28页 484K
描述
SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

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SNJ54ACT8997FK 技术参数

生命周期：Active零件包装代码：QLCC
包装说明：LCC-28针数：28
Reach Compliance Code：not_compliantHTS代码：8542.31.00.01
Factory Lead Time：6 weeks风险等级：5.05
Is Samacsys：N外部数据总线宽度：
JESD-30 代码：S-CQCC-N28长度：11.43 mm
端子数量：28最高工作温度：125 °C
最低工作温度：-55 °C封装主体材料：CERAMIC, METAL-SEALED COFIRED
封装代码：QCCN封装等效代码：LCC28,.45SQ
封装形状：SQUARE封装形式：CHIP CARRIER
峰值回流温度（摄氏度）：NOT SPECIFIED电源：5 V
认证状态：Not Qualified筛选级别：MIL-PRF-38535
座面最大高度：2.03 mm子类别：Other Microprocessor ICs
最大压摆率：100 mA最大供电电压：5.5 V
最小供电电压：4.5 V标称供电电压：5 V
表面贴装：YES技术：CMOS
温度等级：MILITARY端子形式：NO LEAD
端子节距：1.27 mm端子位置：QUAD
处于峰值回流温度下的最长时间：NOT SPECIFIED宽度：11.43 mm
uPs/uCs/外围集成电路类型：MICROPROCESSOR CIRCUITBase Number Matches：1

SNJ54ACT8997FK 数据手册

 浏览型号SNJ54ACT8997FK的Datasheet PDF文件第2页浏览型号SNJ54ACT8997FK的Datasheet PDF文件第3页浏览型号SNJ54ACT8997FK的Datasheet PDF文件第4页浏览型号SNJ54ACT8997FK的Datasheet PDF文件第5页浏览型号SNJ54ACT8997FK的Datasheet PDF文件第6页浏览型号SNJ54ACT8997FK的Datasheet PDF文件第7页 
SN54ACT8997, SN74ACT8997  
SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES  
SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS  
SCAS157D – APRIL 1990 – REVISED DECEMBER 1996  
SN54ACT8997 . . . JT PACKAGE  
SN74ACT8997 . . . DW OR NT PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Serial Test Bus  
DCO  
MCO  
DCI  
MCI  
TRST  
ID1  
ID2  
ID3  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
Allow Partitioning of System Scan Paths  
Can Be Cascaded Horizontally or Vertically  
2
DTDO1  
DTDO2  
DTDO3  
DTDO4  
GND  
DTMS1  
DTMS2  
DTMS3  
DTMS4  
DTCK  
3
4
Select Up to Four Secondary Scan Paths to  
Be Included in a Primary Scan Path  
5
6
Include 8-Bit Programmable Binary Counter  
to Count or Initiate Interrupt Signals  
ID4  
7
V
8
CC  
Include 4-Bit Identification Bus for  
Scan-Path Identification  
DTDI1  
DTDI2  
DTDI3  
DTDI4  
TDI  
9
10  
11  
12  
13  
14  
Inputs Are TTL Compatible  
EPIC (Enhanced-Performance Implanted  
CMOS) 1-µm Process  
TDO  
TMS  
TCK  
Package Options Include Plastic  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Plastic  
(NT) and Ceramic (JT) 300-mil DIPs  
SN54ACT8997 . . . FK PACKAGE  
(TOP VIEW)  
description  
The ’ACT8997 are members of the Texas  
Instruments SCOPE testability integrated-  
circuit family. This family of components facilitates  
testing of complex circuit-board assemblies.  
4
3
2 1 28 27 26  
5
6
7
8
9
25  
24  
23  
22  
21  
20  
19  
TRST  
MCI  
DCI  
DCO  
MCO  
DTDI3  
DTDI4  
TDI  
TCK  
TMS  
The ’ACT8997 enhance the scan capability of TI’s  
SCOPE family by allowing augmentation of a  
system’s primary scan path with secondary scan  
paths (SSPs), which can be individually selected  
by the ’ACT8997 for inclusion in the primary scan  
path. These devices also provide buffering of test  
signals to reduce the need for external logic.  
10  
11  
DTDO1  
DTDO2  
TDO  
DTCK  
12 13 14 15 16 17 18  
By loading the proper values into the instruction  
register and data registers, the user can select up  
to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any  
of the device’s six data registers or the instruction register can be placed in the device’s scan path, i.e., placed  
between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.  
All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit  
programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and  
output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on  
either the rising or falling edge of DCI.  
The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1.  
The SN54ACT8997 is characterized for operation over the full military temperature range of –55°C to 125°C.  
The SN74ACT8997 is characterized for operation from 0°C to 70°C.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE and EPIC are trademarks of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...28

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SNJ54ACT8997FK 替代型号

型号 品牌 替代类型 描述 数据表
5962-9323901Q3A TI

完全替代

 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP

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