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SN74AUP1G06_10

更新时间： 2024-11-02 09:15:19
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德州仪器 - TI 驱动器输出元件
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21页 927K
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LOW-POWER SINGLE INVERTER BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS

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SN74AUP1G06_10 数据手册

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SN74AUP1G06  
www.ti.com  
SCES590D –JULY 2004–REVISED MAY 2010  
LOW-POWER SINGLE INVERTER BUFFER/DRIVER  
WITH OPEN-DRAIN OUTPUTS  
Check for Samples: SN74AUP1G06  
1
FEATURES  
•
•
•
Available in the Texas Instruments NanoStar™  
Package  
Input (Vhys = 250 mV Typ at 3.3 V)  
Wide Operating VCC Range of 0.8 V to 3.6 V  
Optimized for 3.3-V Operation  
•
•
•
Low Static-Power Consumption  
(ICC = 0.9 mA Max)  
3.6-V I/O Tolerant to Support Mixed-Mode  
Signal Operation  
Low Dynamic-Power Consumption  
(Cpd = 1 pF Typ at 3.3 V)  
•
•
•
tpd = 3.6 ns Max at 3.3 V  
•
•
Low Input Capacitance (Ci = 1.5 pF Typ)  
Suitable for Point-to-Point Applications  
Low Noise – Overshoot and Undershoot <10%  
of VCC  
Latch-Up Performance Exceeds 100 mA Per  
JESD 78, Class II  
•
•
Ioff Supports Partial Power-Down-Mode  
Operation  
•
ESD Performance Tested Per JESD 22  
–
2000-V Human-Body Model  
(A114-B, Class II)  
Input Hysteresis Allows Slow Input Transition  
and Better Switching Noise Immunity at the  
–
1000-V Charged-Device Model (C101)  
DBV PACKAGE  
(TOP VIEW)  
DCK PACKAGE  
(TOP VIEW)  
VCC  
1
2
3
5
4
N.C.  
A
VCC  
1
2
3
5
N.C.  
A
GND  
Y
4
GND  
Y
DRY PACKAGE  
(TOP VIEW)  
DSF PACKAGE  
(TOP VIEW)  
YFP PACKAGE  
(TOP VIEW)  
1
2
3
6
5
4
1
2
3
6
5
4
A2  
A1  
B1  
1
2
4
3
VCC  
Y
N.C.  
A
VCC  
N.C.  
Y
N.C.  
A
V
A
CC  
B2  
GND  
N.C.  
Y
GND  
GND  
See mechanical drawings for dimensions.  
N.C. – No internal connection  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2004–2010, Texas Instruments Incorporated  
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