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SN74ALVCH16903_06

更新时间： 2024-09-16 05:29:35
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德州仪器 - TI 驱动器输出元件
页数 文件大小 规格书
16页 221K
描述
3.3-V 12-BIT UNIVERSAL BUS DRIVER WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS

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SN74ALVCH16903_06 数据手册

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SN74ALVCH16903  
3.3-V 12-BIT UNIVERSAL BUS DRIVER  
WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS  
www.ti.com  
SCES095D–MARCH 1997–REVISED SEPTEMBER 2004  
FEATURES  
DGG, DGV, OR DL PACKAGE  
•
Member of the Texas Instruments Widebus™  
(TOP VIEW)  
Family  
1
56  
55  
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
CLK  
OE  
1Y1  
1Y2  
GND  
2Y1  
2Y2  
•
EPIC™ (Enhanced-Performance Implanted  
CMOS) Submicron Process  
2
1A  
3
11A/YERREN  
GND  
11Y1  
•
•
Checks Parity  
4
Able to Cascade With a Second  
SN74ALVCH16903  
5
6
11Y2  
•
ESD Protection Exceeds 2000 V Per  
MIL-STD-883, Method 3015; Exceeds 200 V  
Using Machine Model (C = 200 pF, R = 0)  
7
V
CC  
V
CC  
8
2A  
3Y1  
3Y2  
4Y1  
GND  
4Y2  
5Y1  
5Y2  
6Y1  
6Y2  
7Y1  
GND  
7Y2  
8Y1  
8Y2  
9
3A  
4A  
•
•
•
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
GND  
12A  
12Y1  
12Y2  
5A  
Bus Hold on Data Inputs Eliminates the Need  
for External Pullup/Pulldown Resistors  
Package Options Include Plastic 300-mil  
Shrink Small-Outline (DL), Thin Shrink  
Small-Outline (DGG), and Thin Very  
Small-Outline (DGV) Packages  
6A  
7A  
GND  
APAR  
8A  
DESCRIPTION  
This 12-bit universal bus driver is designed for 2.3-V  
to 3.6-V VCC operation.  
YERR  
V
CC  
V
CC  
The SN74ALVCH16903 has dual outputs and can  
operate as a buffer or an edge-triggered register. In  
both modes, parity is checked on APAR, which  
arrives one cycle after the data to which it applies.  
The YERR output, which is produced one cycle after  
APAR, is open drain.  
9A  
MODE  
GND  
9Y1  
9Y2  
GND  
10A  
10Y1  
PARI/O  
CLKEN  
10Y2  
PAROE  
MODE selects one of the two data paths. When  
MODE is low, the device operates as an  
edge-triggered register. On the positive transition of  
the clock (CLK) input and when the clock-enable  
(CLKEN) input is low, data set up at the A inputs is stored in the internal registers. On the positive transition of  
CLK and when CLKEN is high, only data set up at the 9A–12A inputs is stored in their internal registers. When  
MODE is high, the device operates as a buffer and data at the A inputs passes directly to the outputs.  
11A/YERREN serves a dual purpose; it acts as a normal data bit and also enables YERR data to be clocked into  
the YERR output register.  
When used as a single device, parity output enable (PAROE) must be tied high; when parity input/output  
(PARI/O) is low, even parity is selected and when PARI/O is high, odd parity is selected. When used in pairs and  
PAROE is low, the parity sum is output on PARI/O for cascading to the second SN74ALVCH16903. When used  
in pairs and PAROE is high, PARI/O accepts a partial parity sum from the first SN74ALVCH16903.  
A buffered output-enable (OE) input can be used to place the 24 outputs and YERR in either a normal logic state  
(high or low logic levels) or a high-impedance state. In the high-impedance state, the outputs neither load nor  
drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus  
lines without need for interface or pullup components.  
OE does not affect the internal operation of the device. Old data can be retained or new data can be entered  
while the outputs are in the high-impedance state.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Widebus, EPIC are trademarks of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 1997–2004, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
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