SN74ALS29841
10-BIT BUS-INTERFACE D-TYPE LATCH
WITH 3-STATE OUTPUTS
SDAS149A – JUNE 1988 – REVISED JANUARY 1995
DW OR NT PACKAGE
(TOP VIEW)
• 3-State Buffer-Type Outputs Drive Bus
Lines Directly
• Bus-Structured Pinout
• Provides Extra Bus-Driving Latches
Necessary for Wider Address/Data Paths or
Buses With Parity
OE
1D
2D
3D
4D
5D
6D
7D
8D
V
CC
1
2
3
4
5
6
7
8
9
24
23 1Q
22 2Q
21 3Q
20 4Q
19 5Q
18 6Q
17 7Q
16 8Q
15 9Q
14 10Q
13 LE
• Buffered Control Inputs Reduce dc Loading
Effects
• Power-Up High-Impedance State
• Package Options Include Plastic
Small-Outline (DW) Packages and Standard
Plastic (NT) 300-mil DIPs
9D 10
10D 11
GND 12
description
This 10-bit latch features 3-state outputs designed
specifically for driving highly capacitive or relatively low-impedance loads. It is particularly suitable for
implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.
The ten latches are transparent D-type latches. The SN74ALS29841 has noninverting data (D) inputs.
A buffered output-enable (OE) input can place the ten outputs in either a normal logic state (high or low logic
levels) or in a high-impedance state. The outputs also are in the high-impedance state during power-up and
power-down conditions. The outputs remain in the high-impedance state while the device is powered down. In
the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance
state and increased drive provide the capability to drive bus lines without interface or pullup components.
OE does not affect the internal operation of the latches. Old data can be retained or new data can be entered
while the outputs are off.
The SN74ALS29841 is characterized for operation from 0°C to 70°C.
FUNCTION TABLE
INPUTS
OUTPUT
Q
OE
L
LE
H
H
L
D
H
L
H
L
L
L
X
X
Q
0
H
X
Z
Copyright 1995, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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