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SN54LS222A PDF预览

SN54LS222A

更新时间: 2024-09-15 12:22:35
品牌 Logo 应用领域
德州仪器 - TI 存储输出元件
页数 文件大小 规格书
12页 252K
描述
16 × 4 SYNCHRONOUS FIRST-IN, FIRST-OUT MEMORY WITH 3-STATE OUTPUTS

SN54LS222A 数据手册

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SN54LS222A  
16 × 4 SYNCHRONOUS FIRST-IN, FIRST-OUT MEMORY  
WITH 3-STATE OUTPUTS  
SDLS959A – DECEMBER 2001 – REVISED APRIL 2003  
J PACKAGE  
(TOP VIEW)  
Independent Synchronous Inputs and  
Outputs  
16 Words by 4 Bits Each  
OE  
IRE  
IR  
LDCK  
D0  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
V
CC  
3-State Outputs Drive Bus Lines Directly  
Data Rates up to 10 MHz  
UNCK  
ORE  
OR  
Q0  
NC  
Q1  
Q2  
Q3  
CLR  
Fall-Through Time 50 ns Typical  
Data Terminals Arranged for Printed Circuit  
Board Layout  
NC  
D1  
D2  
D3  
Expandable, Using External Gating  
Packaged in Standard Ceramic (J) 300-mil  
DIPs  
GND  
NC – No internal connection  
description  
The SN54LS222A 64-bit, low-power Schottky memory is organized as 16 words by 4 bits each. It can be  
expanded in multiples of 15m + 1 words or 4n bits, or both (where n is the number of packages in the vertical  
array, and m is the number of packages in the horizontal array); however, some external gating is required. For  
longer words, the input-ready (IR) signals of the first-rank packages and output-ready (OR) signals of the  
last-rank packages must be ANDed for proper synchronization.  
A first-in, first-out (FIFO) memory is a storage device that allows data to be written to and read from its array  
at independent data rates. These FIFOs are designed to process data at rates up to 10 MHz in a bit-parallel  
format, word by word.  
The load clock (LDCK) normally is held low, and data is written into memory on the high-to-low transition of  
LDCK. The unload clock (UNCK) normally is held high, and data is read out on the low-to-high transition of  
UNCK. The memory is full when the number of words clocked in exceeds by 16 the number of words clocked  
out. When the memory is full, LDCK signals have no effect on the data residing in memory. When the memory  
is empty, UNCK signals have no effect.  
Status of the FIFO memory is monitored by the IR and OR flags that indicate not-full and not-empty conditions.  
IR is high only when the memory is not full and LDCK is low. OR is high only when the memory is not empty  
and UNCK is high.  
A low level on the clear (CLR) input resets the internal stack-control pointers and also sets IR high and OR low  
to indicate that old data remaining at the data outputs is invalid. Data outputs are noninverting with respect to  
the data inputs and are at high impedance when the output-enable (OE) input is low. OE does not affect the IR  
and OR outputs.  
The SN54LS222A is characterized over the full military temperature range of –55°C to 125°C.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 2003, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
unless otherwise noted. On all other products, production  
testing of all parameters.  
processing does not necessarily include testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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