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RN1704JE PDF预览

RN1704JE

更新时间: 2024-10-31 12:23:03
品牌 Logo 应用领域
东芝 - TOSHIBA 开关驱动
页数 文件大小 规格书
8页 550K
描述
Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN1704JE 数据手册

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RN1701JE~RN1706JE  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Bias Resistor Built-in Transistor)  
RN1701JE,RN1702JE,RN1703JE  
RN1704JE,RN1705JE,RN1706JE  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Two devices are incorporated into an Extreme-Super-Mini (5 pin)  
package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enables the manufacture of ever more compact  
equipment and lowers assembly cost.  
A wide range of resistor values is available for use in various circuit  
designs.  
Complementary to RN2701JE~RN2706JE  
1.BASE1  
2.EMITTER  
3.BASE2  
4.COLLECTOR2  
5.COLLECTOR1  
(B1)  
(E)  
(B2)  
(C2)  
(C1)  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
RN1701JE  
RN1702JE  
RN1703JE  
RN1704JE  
RN1705JE  
RN1706JE  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
R1  
JEDEC  
JEITA  
B
22  
47  
TOSHIBA  
2-2P1D  
E
2.2  
4.7  
Weight: 0.003 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common)  
Equivalent Circuit  
(top view)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
5
4
V
V
50  
50  
V
V
CBO  
CEO  
RN1701JE~  
1706JE  
Q1  
Q2  
Collector-emitter voltage  
RN1701JE~  
1704JE  
10  
5
Emitter-base voltage  
V
C
V
EBO  
RN1705JE,  
RN1706JE  
1
2
3
Collector current  
I
100  
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
(Note 1)  
RN1701JE~  
1706JE  
T
j
150  
T
55~150  
°C  
stg  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
1
2007-11-01  

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