Datasheet > NUP2105L

NUP2105L

更新时间： 2024-09-17 17:15:43

品牌	Logo	应用领域
友台半导体 - UMW		脉冲
页数	文件大小	规格书
4页	386K
描述
反向截止电压（Vrwm）:24v;极性/通道数（Channel）:2-Line，Bidirectional;击穿电压（VBR):26.2v;峰值脉冲电流(Ipp):5A;最大钳位电压(Vc):40V;电容（Cj）:30pF

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NUP2105L 数据手册

NUP2105L

UMW

Dual Line CAN Bus Protector

The NUP2105L has been designed to protect the CAN

transceiver in high−speed and fault tolerant networks

from ESD and other harmful transient voltage events.

This device provides bidirectional protection for each

data line with a single compact SOT−23 package,

giving the system designer a low cost option for

improving system reliability and meeting stringent EMI

requirements.

Applications

Features

■

350 W Peak Power Dissipation per Line (8 x 20sec Waveform)

Low Reverse Leakage Current (< 100 nA)

Industrial Control Networks

Smart Distribution Systems (SDS^

)



DeviceNet

■

Low Capacitance High−Speed CAN Data Rates

− −

Automotive Networks

Low and High−Speed CAN

Fault Tolerant CAN

IEC Compatibility: − IEC 61000 4 2 (ESD): Level 4

−

− −

IEC 61000 4 4 (EFT): 40 A – 5/50ns

−

− −

IEC 61000 4 5 (Lighting) 8.0 A (8/20μs)

−

■

ISO 7637 1, Nonrepetitive EMI Surge Pulse 2, 9.5 A

(1 x 50μs)

ISO 7637−3, Repetitive Electrical Fast Transient (EFT)

EMI Surge Pulses, 50 A (5 x 50 ns)

■

−

Flammability Rating UL 94 V 0

AEC−Q101 Qualified and PPAP Capable

SZ Prefix for Automotive and Other Applications Requiring Unique

Site and Control Change Requirements

■

Pb−Free Packages are Available*

MAXIMUM RATINGS (T_J= 25℃, unless otherwise specified)

Symbol

Rating

Value

Unit

Peak Power Dissipation

PPK

350

8 x 20

s Double Exponential Waveform (Note 1)

Operating Junction Temperature Range

Storage Temperature Range

−

C

55 to 150

−

55 to 150

Lead Solder Temperature (10 s)

260



Human Body model (HBM)

400

ESD

Machine Model (MM)

⁻2 Specification (Contact)

−

IEC 61000

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

www.umw-ic.com

友台半导体有限公司

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