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NB4N527SMNEVB

更新时间： 2024-10-01 05:51:55

品牌	Logo	应用领域
安森美 - ONSEMI		/
页数	文件大小	规格书
8页	316K
描述
Evaluation Board Manual for NB4N527S

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NB4N527SMNEVB 数据手册

NB4N527SMNEVB

Evaluation Board Manual

for NB4N527S

http://onsemi.com

EVALUATION BOARD MANUAL

Board Lay−Up

INTRODUCTION

The 16−lead QFN evaluation board is implemented in

four layers with split (dual) power supplies (Figure 2,

Evaluation Board Lay−up). For standard lab setup, a split

(dual) power supply is essential to enable the 50 W internal

impedance in the oscilloscope as a device termination. The

first layer or primary trace layer is 0.005, thick Rogers

RO6002 material, which is designed to have equal electrical

length on all signal traces from the device under the test

(DUT) to the sense output. The second layer is the 1.0 oz.

copper ground plane. The FR4 dielectric material is placed

between the second and third layer, and between the third

and fourth layer. The third layer is also a 1.0 oz copper

ground plane. The fourth layer is the secondary trace layer.

ON Semiconductor has developed an evaluation board for

the NB4N527S device as a convenience for the customers

interested in performing their own device engineering

assessment. This board provides a high bandwidth 50 W

controlled impedance environment. The pictures in Figure 1

show the top and bottom view of the evaluation board, which

can be configured in several different ways.

This evaluation board manual contains:

• Information on 16−lead QFN Evaluation Board

• Assembly Instructions

• Appropriate Lab Setup

• Bill of Materials

This manual should be used in conjunction with the

NB4N527S device data sheet, which contains full technical

details on the device specifications and operation.

Top View

Bottom View

Figure 1. Top and Bottom View of the 16 QFN Evaluation Board

Publication Order Number:

September, 2008 − Rev. 1

NB4N527SMNEVB/D

12 3 4 5 6 7 8

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